Publicação: Rebound effect on Charged Based Bio-TFETs for different biomolecules
dc.contributor.author | Macambira, C. N. | |
dc.contributor.author | Agopian, P. G. D. [UNESP] | |
dc.contributor.author | Martino, J. A. | |
dc.contributor.author | IEEE | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.date.accessioned | 2020-12-10T17:58:55Z | |
dc.date.available | 2020-12-10T17:58:55Z | |
dc.date.issued | 2019-01-01 | |
dc.description.abstract | In this work, the charged biomolecules with different permittivity (epsilon) localized on the drain underlap region of a double gate (DG) N-type tunneling field effect transistor (nTFET) for biosensing purpose (Bio-TFET) is presented. The fixed charges are localized at the interface between the biomaterial and the silicon channel. The main studied parameter of the charged Bio-TFET is the sensitivity. In the charge range studied, the results show that the device presents higher sensitivity for lower dielectric constant biomolecules (e.g., thiol linkers and biotin) and it was also observed a rebound effect on the drain current (and sensitivity) for high concentration ( > 1x10(12) cm(-2)) of positive fixed charges. This rebound effect is caused by the shift of the electric field peak from the drain/channel to the gate/biomaterial regions. | en |
dc.description.affiliation | Univ Sao Paulo, USP, PSI, LSI, Sao Paulo, Brazil | |
dc.description.affiliation | Sao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, Brazil | |
dc.description.affiliationUnesp | Sao Paulo State Univ, UNESP, Sao Joao Da Boa Vista, Brazil | |
dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) | |
dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
dc.format.extent | 3 | |
dc.identifier.citation | 2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis). New York: Ieee, 3 p., 2019. | |
dc.identifier.issn | 2330-5738 | |
dc.identifier.uri | http://hdl.handle.net/11449/195644 | |
dc.identifier.wos | WOS:000565067300006 | |
dc.language.iso | eng | |
dc.publisher | Ieee | |
dc.relation.ispartof | 2019 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis) | |
dc.source | Web of Science | |
dc.subject | TFET | |
dc.subject | Biosensor | |
dc.subject | Bio-TFET | |
dc.subject | Permittivity | |
dc.subject | Charge | |
dc.subject | Sensitivity | |
dc.subject | Rebound | |
dc.title | Rebound effect on Charged Based Bio-TFETs for different biomolecules | en |
dc.type | Trabalho apresentado em evento | pt |
dcterms.license | http://www.ieee.org/publications_standards/publications/rights/rights_policies.html | |
dcterms.rightsHolder | Ieee | |
dspace.entity.type | Publication | |
unesp.campus | Universidade Estadual Paulista (UNESP), Faculdade de Engenharia, São João da Boa Vista | pt |