Publicação: Sem título
dc.contributor.author | Ribeiro, Rosinei B. [UNESP] | |
dc.contributor.author | De O. Hein, Luis Rogerio [UNESP] | |
dc.contributor.author | Robin, Alain | |
dc.contributor.institution | Fac. de Engenharia Quimica de Lorena | |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | |
dc.date.accessioned | 2022-04-28T19:55:50Z | |
dc.date.available | 2022-04-28T19:55:50Z | |
dc.date.issued | 2003-01-01 | |
dc.description.abstract | The chemical and electrochemical behaviour of the Ti-15V-3Cr-3Sn-3Al alloy in Kroll reagent has been studied after ageing at 350-600°C, to optimise metallographic etching. Etching tests and polarisation curves showed that samples aged at higher temperatures have been more susceptible to corrosion. It has been attributed to the formation of intra- and intergranular α-phase precipitates during ageing. | en |
dc.description.affiliation | Dept. de Engenharia de Materials Fac. de Engenharia Quimica de Lorena, CP 116 - 12600-000-Lorena - SP | |
dc.description.affiliation | Depto. de Materiais e Tecnologia Fac. de Engenharia de Guaratingueta Universidade Estadual Paulista, CP 205- 12516-410-Guaratingueta-SP | |
dc.description.affiliationUnesp | Depto. de Materiais e Tecnologia Fac. de Engenharia de Guaratingueta Universidade Estadual Paulista, CP 205- 12516-410-Guaratingueta-SP | |
dc.format.extent | 16-23 | |
dc.identifier.citation | Praktische Metallographie/Practical Metallography, v. 40, n. 1, p. 16-23, 2003. | |
dc.identifier.issn | 0032-678X | |
dc.identifier.scopus | 2-s2.0-0037257311 | |
dc.identifier.uri | http://hdl.handle.net/11449/224302 | |
dc.language.iso | deu | |
dc.language.iso | eng | |
dc.relation.ispartof | Praktische Metallographie/Practical Metallography | |
dc.source | Scopus | |
dc.title.alternative | Influence of aged Ti-15V-3Cr-3Sn-3Al alloy microstructure on chemical and electrochemical behavior in the Kroll reagent for metallographic etching | en |
dc.type | Artigo | |
dspace.entity.type | Publication | |
unesp.department | Materiais e Tecnologia - FEG | pt |