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Evaluating the residual stress in PbTiO3 thin films prepared by a polymeric chemical method

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dc.contributor.authorValim, D.
dc.contributor.authorSouza, A. G.
dc.contributor.authorFreire, PTC
dc.contributor.authorMendes, J.
dc.contributor.authorGuarany, C. A.
dc.contributor.authorReis, R. N.
dc.contributor.authorAraujo, E. B.
dc.contributor.institutionUniversidade Federal do Ceará (UFC)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:28:28Z
dc.date.available2014-05-20T15:28:28Z
dc.date.issued2004-03-07
dc.description.abstractWe report a study of residual stress in PbTiO3 (PT) thin films prepared on Si substrates by a polymeric chemical method. The E(1TO) frequency was used to evaluate the residual stress through an empirical equation available for bulk PT. We find that the residual stress in PT films increases as the film thickness decreases and conclude that it originates essentially from the contributions of extrinsic and intrinsic factors. Polarized Raman experiments showed that the PT films prepared by a polymeric chemical method are somewhat a-domain (polar axis c parallel to the substrate) oriented.en
dc.description.affiliationUniv Fed Ceara, Dept Fis, BR-60455900 Fortaleza, Ceara, Brazil
dc.description.affiliationUniv Estadual Paulista, Dept Quim & Fis, BR-15385000 São Paulo, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Dept Quim & Fis, BR-15385000 São Paulo, Brazil
dc.format.extent744-747
dc.identifierhttp://dx.doi.org/10.1088/0022-3727/37/5/015
dc.identifier.citationJournal of Physics D-applied Physics. Bristol: Iop Publishing Ltd, v. 37, n. 5, p. 744-747, 2004.
dc.identifier.doi10.1088/0022-3727/37/5/015
dc.identifier.issn0022-3727
dc.identifier.lattes9803426672221802
dc.identifier.lattes6725982228402054
dc.identifier.urihttp://hdl.handle.net/11449/38266
dc.identifier.wosWOS:000220190200017
dc.language.isoeng
dc.publisherIop Publishing Ltd
dc.relation.ispartofJournal of Physics D: Applied Physics
dc.relation.ispartofjcr2.373
dc.relation.ispartofsjr0,717
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleEvaluating the residual stress in PbTiO3 thin films prepared by a polymeric chemical methoden
dc.typeArtigo
dcterms.licensehttp://iopscience.iop.org/page/copyright
dcterms.rightsHolderIop Publishing Ltd
dspace.entity.typePublication
unesp.author.lattes9803426672221802
unesp.author.lattes6725982228402054
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Ilha Solteirapt
unesp.departmentFísica e Química - FEISpt

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Ilha Solteira - FEIS - Faculdade de Engenharia