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The failure analyses on ZnO varistors used in high tension devices

dc.contributor.authorRamirez, M. A.
dc.contributor.authorBueno, Paulo Roberto [UNESP]
dc.contributor.authorRibeiro, W. C.
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.authorBonett, D. A.
dc.contributor.authorVilla, J. M.
dc.contributor.authorMarquez, M. A.
dc.contributor.authorRojo, C. R.
dc.contributor.institutionNatl Univ Colombia
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:28:29Z
dc.date.available2014-05-20T15:28:29Z
dc.date.issued2005-11-01
dc.description.abstractThe main purpose of this work is to evaluate the failure caused by electrical discharge on commercial ZnO varistor doped with oxide of Bi, Sb, Si, Cr, Co utilized in electric transmission systems. In order to observe the effect of electrical discharge over the microstructure and electrical properties of the varistors, two kinds of pulses were applied: long pulse (2000 ms) and short pulse (8/20 mu s). In both cases, a decrease in grain size and increase in micropores and leakage current were observed. The degraded samples present oxygen defficiency mainly in the grain boundary and phase tranformation from the bismuth oxide phase. (c) 2005 Springer Science+ Business Media, Inc.en
dc.description.affiliationNatl Univ Colombia, Fac Mines, Appl Mineral Grp GMA, Medellin, Colombia
dc.description.affiliationUNESP, Paulista State Univ, Inst Chem, BR-14801970 Araraquara, SP, Brazil
dc.description.affiliationUnespUNESP, Paulista State Univ, Inst Chem, BR-14801970 Araraquara, SP, Brazil
dc.format.extent5591-5596
dc.identifierhttp://dx.doi.org/10.1007/s10853-005-1366-4
dc.identifier.citationJournal of Materials Science. Dordrecht: Springer, v. 40, n. 21, p. 5591-5596, 2005.
dc.identifier.doi10.1007/s10853-005-1366-4
dc.identifier.issn0022-2461
dc.identifier.lattes0477045906733254
dc.identifier.orcid0000-0003-2827-0208
dc.identifier.urihttp://hdl.handle.net/11449/38280
dc.identifier.wosWOS:000232695400003
dc.language.isoeng
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science
dc.relation.ispartofjcr2.993
dc.relation.ispartofsjr0,807
dc.rights.accessRightsAcesso restritopt
dc.sourceWeb of Science
dc.titleThe failure analyses on ZnO varistors used in high tension devicesen
dc.typeArtigopt
dcterms.licensehttp://www.springer.com/open+access/authors+rights?SGWID=0-176704-12-683201-0
dcterms.rightsHolderSpringer
dspace.entity.typePublication
relation.isOrgUnitOfPublicationbc74a1ce-4c4c-4dad-8378-83962d76c4fd
relation.isOrgUnitOfPublication.latestForDiscoverybc74a1ce-4c4c-4dad-8378-83962d76c4fd
unesp.author.lattes0477045906733254[2]
unesp.author.orcid0000-0003-2827-0208[2]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.departmentFísico-Química - IQARpt

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