InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
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Undergraduate course
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Int Union Crystallography
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Keywords
semiconductor epitaxy, X-ray multiple diffraction, strain determination
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English
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Acta Crystallographica A-foundation And Advances. Chester: Int Union Crystallography, v. 64, p. C592-C592, 2008.
