Publicação: InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan
| dc.contributor.author | Cardoso, Lisandro P. | |
| dc.contributor.author | Menezes, Alan S. de | |
| dc.contributor.author | Santos, Adenilson O. dos | |
| dc.contributor.author | Bortoleto, Jose R. [UNESP] | |
| dc.contributor.author | Cotta, Monica A. | |
| dc.contributor.author | Morelhao, Sergio L. | |
| dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | |
| dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
| dc.contributor.institution | Universidade de São Paulo (USP) | |
| dc.date.accessioned | 2020-12-10T20:12:48Z | |
| dc.date.available | 2020-12-10T20:12:48Z | |
| dc.date.issued | 2008-01-01 | |
| dc.description.affiliation | Univ Estadual Campinas, Inst Fis Gleb Wataghin, Dept Fis Aplicada, BR-13083970 Campinas, SP, Brazil | |
| dc.description.affiliation | UNESP, ECA, BR-18087180 Sorocaba, SP, Brazil | |
| dc.description.affiliation | Univ Sao Paulo, Inst Fis, BR-05508090 Sao Paulo, SP, Brazil | |
| dc.description.affiliationUnesp | UNESP, ECA, BR-18087180 Sorocaba, SP, Brazil | |
| dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) | |
| dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
| dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
| dc.format.extent | C592-C592 | |
| dc.identifier | http://dx.doi.org/10.1107/S0108767308080987 | |
| dc.identifier.citation | Acta Crystallographica A-foundation And Advances. Chester: Int Union Crystallography, v. 64, p. C592-C592, 2008. | |
| dc.identifier.doi | 10.1107/S0108767308080987 | |
| dc.identifier.issn | 2053-2733 | |
| dc.identifier.uri | http://hdl.handle.net/11449/197308 | |
| dc.identifier.wos | WOS:000480420705297 | |
| dc.language.iso | eng | |
| dc.publisher | Int Union Crystallography | |
| dc.relation.ispartof | Acta Crystallographica A-foundation And Advances | |
| dc.source | Web of Science | |
| dc.subject | semiconductor epitaxy | |
| dc.subject | X-ray multiple diffraction | |
| dc.subject | strain determination | |
| dc.title | InGaP/GaAs(001) structural characterization by means of synchrotron radiation Renninger Scan | en |
| dc.type | Resumo | |
| dcterms.rightsHolder | Int Union Crystallography | |
| dspace.entity.type | Publication | |
| unesp.campus | Universidade Estadual Paulista (UNESP), Instituto de Física Teórica (IFT), São Paulo | pt |