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Probing free-carrier recombination in silicon strip nano-waveguides

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dc.contributor.authorAldaya, Ivan
dc.contributor.authorGil-Molina, Andres
dc.contributor.authorPita, Julian L.
dc.contributor.authorGabrielli, Lucas H.
dc.contributor.authorFragnito, Hugo L.
dc.contributor.authorDainese, Paulo
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.contributor.institutionMackenzie Presbyterian University
dc.date.accessioned2022-04-28T19:11:02Z
dc.date.available2022-04-28T19:11:02Z
dc.date.issued2018-08-06
dc.description.abstractWe analyze recombination dynamics of photo-generated free-carriers in strip silicon nanowaveguides, revealing a highly nonlinear decay dynamics with a time-dependent lifetime ranging from ∼800 ps at the beginning to ∼300 ns at the end of the decay.en
dc.description.affiliationGleb Wataghin Physics Institute State University of São Paulo
dc.description.affiliationCampus São João da Boa Vista State University of São Paulo
dc.description.affiliationSchool of Electrical and Computer Engineering University of Campinas
dc.description.affiliationMackGraphe Mackenzie Presbyterian University
dc.identifier.citation2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings.
dc.identifier.scopus2-s2.0-85052586090
dc.identifier.urihttp://hdl.handle.net/11449/221153
dc.language.isoeng
dc.relation.ispartof2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
dc.sourceScopus
dc.titleProbing free-carrier recombination in silicon strip nano-waveguidesen
dc.typeTrabalho apresentado em evento
dspace.entity.typePublication

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