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Calcium doped BiFeO3 films: Rietveld analysis and piezoelectric properties

dc.contributor.authorGoncalves, L. F. [UNESP]
dc.contributor.authorRocha, L. S.R. [UNESP]
dc.contributor.authorLongo, E. [UNESP]
dc.contributor.authorSimões, A. Z. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2018-12-11T17:34:34Z
dc.date.available2018-12-11T17:34:34Z
dc.date.issued2018-01-01
dc.description.abstractPure and calcium modified CaxBi(1−x)FeO3 (x = 0.0, 0.1, 0.2, 0.30) thin films were fabricated on Pt(111)/Ti/SiO2/Si substrates by the soft chemical method. The crystal structure and physical properties of polycrystalline Ca2+-doped BiFeO3 samples have been investigated. Structural studies by XRD reveal the co-existence of distorted rhombohedral and tetragonal phases in the highest doped BiFeO3 where enhanced piezoelectric properties are produced by internal strain. XPS results show that the oxidation state of Fe was purely 3+, which is beneficial for producing a piezoelectric film with low leakage current. Piezoelectric properties are improved in the highest Ca-doped sample due to the coexistence in the crystal structure of BFO with a primitive cubic perovskite lattice with four-fold symmetry and a large tetragonal distortion within the crystal domain. This observation introduces piezoelectronics at room temperature by combining electronic conduction with electric and magnetic degrees of freedom which are already present in the multiferroic BiFeO3.en
dc.description.affiliationSchool of Engineering Sao Paulo State University (Unesp)
dc.description.affiliationInstitute of Chemistry Sao Paulo State University (Unesp)
dc.description.affiliationUnespSchool of Engineering Sao Paulo State University (Unesp)
dc.description.affiliationUnespInstitute of Chemistry Sao Paulo State University (Unesp)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipIdFAPESP: 2013/07296-2
dc.format.extent784-793
dc.identifierhttp://dx.doi.org/10.1007/s10854-017-7973-4
dc.identifier.citationJournal of Materials Science: Materials in Electronics, v. 29, n. 1, p. 784-793, 2018.
dc.identifier.doi10.1007/s10854-017-7973-4
dc.identifier.file2-s2.0-85031928682.pdf
dc.identifier.issn1573-482X
dc.identifier.issn0957-4522
dc.identifier.scopus2-s2.0-85031928682
dc.identifier.urihttp://hdl.handle.net/11449/179288
dc.language.isoeng
dc.relation.ispartofJournal of Materials Science: Materials in Electronics
dc.relation.ispartofsjr0,503
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.titleCalcium doped BiFeO3 films: Rietveld analysis and piezoelectric propertiesen
dc.typeArtigo
dspace.entity.typePublication
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt
unesp.departmentMateriais e Tecnologia - FEGpt
unesp.departmentBioquímica e Tecnologia - IQpt

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