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Nonlinear control system applied to atomic force microscope including parametric errors

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dc.contributor.authorNozaki, Ricardo [UNESP]
dc.contributor.authorBalthazar, José Manoel [UNESP]
dc.contributor.authorTusset, Angelo Marcelo
dc.contributor.authorDe Pontes Jr., Bento Rodrigues [UNESP]
dc.contributor.authorBueno, Átila Madureira
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade Tecnológica Federal Do Paraná - UTFPR
dc.date.accessioned2014-05-27T11:29:34Z
dc.date.available2014-05-27T11:29:34Z
dc.date.issued2013-06-01
dc.description.abstractThe performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique. © 2013 Brazilian Society for Automatics - SBA.en
dc.description.affiliationUniversidade Estadual Paulista - UNESP, Av. Luiz Edmundo Carrijo Coube, Bauru, SP 14-01
dc.description.affiliationDepartamento de Estatística Matemática Aplicada e Computacional Universidade Estadual Paulista - UNESP, Avenida 24A. 1515. Bela Vista Caixa-postal: 178, Rio-Claro SP 13506-700
dc.description.affiliationUniversidade Tecnológica Federal Do Paraná - UTFPR, Av. Monteiro Lobato s.n., km 4, Ponta Grossa, PR 84019-919
dc.description.affiliationUnespUniversidade Estadual Paulista - UNESP, Av. Luiz Edmundo Carrijo Coube, Bauru, SP 14-01
dc.description.affiliationUnespDepartamento de Estatística Matemática Aplicada e Computacional Universidade Estadual Paulista - UNESP, Avenida 24A. 1515. Bela Vista Caixa-postal: 178, Rio-Claro SP 13506-700
dc.format.extent223-231
dc.identifierhttp://dx.doi.org/10.1007/s40313-013-0034-1
dc.identifier.citationJournal of Control, Automation and Electrical Systems, v. 24, n. 3, p. 223-231, 2013.
dc.identifier.doi10.1007/s40313-013-0034-1
dc.identifier.issn2195-3880
dc.identifier.issn2195-3899
dc.identifier.scopus2-s2.0-84879400236
dc.identifier.urihttp://hdl.handle.net/11449/75502
dc.language.isoeng
dc.relation.ispartofJournal of Control, Automation and Electrical Systems
dc.relation.ispartofsjr0,274
dc.relation.ispartofsjr0,274
dc.rights.accessRightsAcesso restrito
dc.sourceScopus
dc.subjectAtomic force microscopy (AFM)
dc.subjectChaos
dc.subjectOptimal linear feedback control (OLFC)
dc.subjectState-dependent Riccati equation (SDRE)
dc.subjectAtomic force microscope (AFM)
dc.subjectChaotic motions
dc.subjectControl techniques
dc.subjectLinear feedback control
dc.subjectParametric errors
dc.subjectParametric uncertainties
dc.subjectState-dependent Riccati equation
dc.subjectChaos theory
dc.subjectFeedback control
dc.subjectOptimization
dc.subjectAtomic force microscopy
dc.titleNonlinear control system applied to atomic force microscope including parametric errorsen
dc.typeArtigo
dcterms.licensehttp://www.springer.com/open+access/authors+rights
dspace.entity.typePublication
unesp.author.lattes7416585768192991[5]
unesp.author.orcid0000-0002-1113-3330[5]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Geociências e Ciências Exatas, Rio Claropt
unesp.departmentEstatística, Matemática Aplicada e Computação - IGCEpt

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Rio Claro - IGCE - Instituto de Geociências e Ciências Exatas