Publicação: Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate
| dc.contributor.author | Vieira, R. A. | |
| dc.contributor.author | Nono, M. C.A. | |
| dc.contributor.author | Cruz, N. C. [UNESP] | |
| dc.contributor.institution | National Institute for Space Research (INPE) | |
| dc.contributor.institution | Universidade Estadual Paulista (UNESP) | |
| dc.date.accessioned | 2022-04-28T19:55:30Z | |
| dc.date.available | 2022-04-28T19:55:30Z | |
| dc.date.issued | 2002-08-15 | |
| dc.description.abstract | The results of nanohardness measurements at a film surface and film-substrate interface are presented and discussed. An electron beam device was used to deposit a Ti film on a 304 stainless steel (304 SS) substrate. The diluted interface was obtained by thermal activated atomic diffusion. The Ti film and Ti film-304 SS interface were analyzed by energy dispersive spectrometry and were observed using atomic force microscopy. The nanohardness of the Ti film-304 SS system was measured by a nanoindentation technique. The results showed the Ti film-304 SS interface had a higher hardness value than the Ti film and 304 SS substrate. The Ti film surface had a lower hardness due to the presence of a TiO2 thin layer. | en |
| dc.description.affiliation | Associated Laboratory for Sensors and Materials (LAS) National Institute for Space Research (INPE), Sao Jose dos Campos, SP | |
| dc.description.affiliation | Physics and Chemistry Department (DFQ) FEG-UNESP, Guaratinguetá, SP | |
| dc.description.affiliationUnesp | Physics and Chemistry Department (DFQ) FEG-UNESP, Guaratinguetá, SP | |
| dc.format.extent | 116-120 | |
| dc.identifier | http://dx.doi.org/10.1002/1521-3951(200207)232:1<116 | |
| dc.identifier.citation | Physica Status Solidi (B) Basic Research, v. 232, n. 1, p. 116-120, 2002. | |
| dc.identifier.doi | 10.1002/1521-3951(200207)232:1<116 | |
| dc.identifier.issn | 0370-1972 | |
| dc.identifier.scopus | 2-s2.0-0036336077 | |
| dc.identifier.uri | http://hdl.handle.net/11449/224251 | |
| dc.language.iso | eng | |
| dc.relation.ispartof | Physica Status Solidi (B) Basic Research | |
| dc.source | Scopus | |
| dc.title | Nanohardness of a Ti thin film and its interface deposited by an electron beam on a 304 SS substrate | en |
| dc.type | Trabalho apresentado em evento | |
| dspace.entity.type | Publication | |
| unesp.department | Física e Química - FEG | pt |