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Interferometric characterization of an XY piezoeletric nanopositioner: Linearity9 Hysteresis and frequency response

dc.contributor.authorMartinez, Guilherme Alves [UNESP]
dc.contributor.authorPereira, Fernando Da Cruz
dc.contributor.authorGaleti, Jose Henrique
dc.contributor.authorHiguti, Ricardo Tokio [UNESP]
dc.contributor.authorNelli Silva, Emilio Carlos
dc.contributor.authorKitano, Claudio [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionCiênciae Tecnologia de São Paulo - IFSP
dc.contributor.institutionIFMS
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2019-10-06T17:04:39Z
dc.date.available2019-10-06T17:04:39Z
dc.date.issued2019-01-25
dc.description.abstractPiezoelectric motors have been considered successors of electromagnetic motors in areas such as robot joints, high precision machines, micro robots, and MEMS (Micro-Electro-Mechanical Systems). The main interest in this work is the investigation of an XY flextensional positioner adapted for future applications as a rotary piezoelectric motor. To perform this task, the mechanical deformation analysis of the actuator structure was evaluated using finite element software. The results obtained with these simulations were validated using an optical phase detection technique using laser interferometry. Information regarding the linearity between applied voltage and generated displacement, hysteresis, frequency response of displacement and mechanical resonances of the actuator were measured between 0 and 3500 Hz. Simulation and experimental results have brought to light many technical issues that will lead to further investigations, helping the improvement the system in future works.en
dc.description.affiliationDepartment of Eletrical Engineering Sao Paulo State University - UNESP
dc.description.affiliationInstituto Federal de Educação Ciênciae Tecnologia de São Paulo - IFSP
dc.description.affiliationFederal Institute of Mato Grosso Do sul IFMS
dc.description.affiliationDepartment of Mechatronics and Mechanical Systems Engineering Escola Politècnica da Universidade de São Paulo - EPUSP SP
dc.description.affiliationUnespDepartment of Eletrical Engineering Sao Paulo State University - UNESP
dc.format.extent1355-1361
dc.identifierhttp://dx.doi.org/10.1109/INDUSCON.2018.8627259
dc.identifier.citation2018 13th IEEE International Conference on Industry Applications, INDUSCON 2018 - Proceedings, p. 1355-1361.
dc.identifier.doi10.1109/INDUSCON.2018.8627259
dc.identifier.lattes6405339510883203
dc.identifier.lattes2883440351895167
dc.identifier.orcid0000-0003-4201-5617
dc.identifier.orcid0000-0001-6320-755X
dc.identifier.scopus2-s2.0-85062538671
dc.identifier.urihttp://hdl.handle.net/11449/190172
dc.language.isoeng
dc.relation.ispartof2018 13th IEEE International Conference on Industry Applications, INDUSCON 2018 - Proceedings
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectInteferometry
dc.subjectMetrology
dc.subjectPiezoelectric transducer
dc.subjectVibration measurement
dc.titleInterferometric characterization of an XY piezoeletric nanopositioner: Linearity9 Hysteresis and frequency responseen
dc.typeTrabalho apresentado em evento
dspace.entity.typePublication
unesp.author.lattes6405339510883203[4]
unesp.author.lattes2883440351895167[6]
unesp.author.orcid0000-0003-4201-5617[4]
unesp.author.orcid0000-0001-6320-755X[6]
unesp.departmentEngenharia Elétrica - FEISpt

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