Physical properties of strontium barium niobate thin films prepared by polymeric chemical method
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Data
2016-01-01
Autores
Melo, M. [UNESP]
Araujo, E. B. [UNESP]
Turygin, A. P.
Shur, V. Ya.
Kholkin, A. L.
Título da Revista
ISSN da Revista
Título de Volume
Editor
Taylor & Francis Ltd
Resumo
Randomly oriented Sr0.75Ba0.25Nb2O6 thin films have been deposited on Pt(111)/Ti/SiO2/Si substrates using a polymeric chemical method to study their physical properties. Refinements of the structure confirm the stoichiometry of the studied films. The relaxor behavior is evidenced by the dielectric measurements and Vogel-Fulcher analysis of the dielectric curves. Lowering the transition temperature (T-m) by about 100K and asymmetries in the local hysteresis loops well above T-m are discussed in terms of the existence of complex defects in thin films.
Descrição
Palavras-chave
Relaxor, hysteresis loop, dielectric measurement, SBN
Como citar
Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 496, n. 1, p. 177-186, 2016.