Ferroelectric phase transition in Pb0.60Sr0.40TiO3 thin films

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Data

2004-10-15

Autores

Leal, S. H.
Pontes, F. M.
Leite, E. R.
Longo, Elson [UNESP]
Pizani, P. S.
Chiquito, A. J.
Machado, MAC
Varela, José Arana [UNESP]

Título da Revista

ISSN da Revista

Título de Volume

Editor

Elsevier B.V.

Resumo

Polycrystalline Pb-0.Sr-60(0).40TiO3 thin films with the tetragonal perovskite structure were grown on platinum-coated silicon substrates by a chemical method. Raman results reveal that A1 (1 TO) symmetry modes, also known as soft modes, persist above the phase transition 14 temperature. This is due to the high structural distortion caused by the substitution effect of Sr2+ for Pb2+ ions. In contrast, the E(1TO) symmetry mode vanishes at 498 K, characterizing the ferroelectric-paraelectric transition phase. However, the Raman spectra, as a function of temperature, reveal that the ferroelectric-paraelectric phase transition may be correlated with a diffuse phase transition. The experimental data obtained from measurements of the dielectric constant as a function of temperature and frequencies showed a classical behavior of ferroelectric phase transition in Pb-0.Sr-60(0).40TiO3 thin films, rather than a relaxor ferroelectric phase transition. (C) 2004 Elsevier B.V. All rights reserved.

Descrição

Palavras-chave

phase transition, chemical synthesis, thin films, Raman spectroscopy

Como citar

Materials Chemistry and Physics. Lausanne: Elsevier B.V. Sa, v. 87, n. 2-3, p. 353-356, 2004.