X-ray reflectivity of zirconia based sol-gel coatings on borosilicate glasses
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Data
1999-05-01
Autores
Rizzato, A. P.
Santilli, Celso Valentim [UNESP]
Pulcinelli, Sandra Helena [UNESP]
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Elsevier B.V.
Resumo
In this work the technique of X-ray reflectometry was applied to study zirconiumsulfate films deposited by sol-gel dip-coating process on a borosilicate glass surface. The influence of withdrawal speed and temperature of thermal treatment on the film structure are analyzed. The thermal evolution of the density and thickness of the film was compared with these properties measured for a monolithic xerogel by helium picnometry and thermomechanical analysis. The fitting of experimental curves by classical reflectivity model showed the presence of an additional layer at the top surface of the coating. Layer thickness increases with increase of withdrawal speed in agreement with the Landau-Levich model. The apparent and real densities are similar for coatings fired below 400 degrees C, which shows that the films are free of pores. The shrinkage during firing is anisotropic, occurring essentially perpendicular to the coating surface. (C) 1999 Elsevier B.V. B.V. All rights reserved.
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Journal of Non-crystalline Solids. Amsterdam: Elsevier B.V., v. 247, p. 158-163, 1999.