Textured PbZr0.3Ti0.7O3 thin films produced by polymeric precursor method using microwave oven
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PbZr0.3Ti0.7O3 (PZT) films were produced by polymeric precursor route and deposited by spin-coater technique on Pt(111)/Ti/SiO2/Si(100) substrates. The films were heat-treated using different furnaces: (a) a conventional furnace, at 700 degrees C; and (b) a domestic microwave oven, at 600 degrees C. The X-ray patterns revealed that both films are single phase and reflections were identified as belongs to the PZT phase. The intensity of these reflections showed a (111), (001) and (100) preferred orientation. Morphological and electrical characterizations showed that all samples present a rather different microstructure and both with high spontaneous polarization.
How to cite this document
Escote, M. T. et al. Textured PbZr0.3Ti0.7O3 thin films produced by polymeric precursor method using microwave oven. Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 335, p. 211-218, 2006. Available at: <http://hdl.handle.net/11449/36218>.