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dc.contributor.authorCosta, Antonio F. B. [UNESP]
dc.date.accessioned2014-05-27T11:19:46Z
dc.date.available2014-05-27T11:19:46Z
dc.date.issued1999-10-01
dc.identifier.citationJournal of Quality Technology, v. 31, n. 4, p. 387-397, 1999.
dc.identifier.issn0022-4065
dc.identifier.urihttp://hdl.handle.net/11449/65859
dc.description.abstractRecent studies have shown that the X̄ chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional X̄ chart. This article extends these studies for processes that are monitored by both the X̄ and R charts. A Markov chain model is used to determine the properties of the joint X and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint X̄ and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.en
dc.format.extent387-397
dc.language.isoeng
dc.relation.ispartofJournal of Quality Technology
dc.sourceScopus
dc.subjectAdjusted Average Time to Signal
dc.subjectMarkov Chains
dc.subjectStatistical Process Control
dc.subjectVariable Sample Size
dc.subjectVariable Sampling Intervals
dc.titleJoint X̄ and R Charts with Variable Sample Sizes and Sampling Intervalsen
dc.typeArtigo
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.description.affiliationUNESP - São Paulo Stt. Univ., Guaratinguetá, 12500-000
dc.description.affiliationUnespUNESP - São Paulo Stt. Univ., Guaratinguetá, 12500-000
dc.rights.accessRightsAcesso restrito
dc.identifier.scopus2-s2.0-0000093252
unesp.author.lattes6100382011052492[1]
unesp.author.orcid0000-0003-2133-1098[1]
dc.relation.ispartofjcr2.306
dc.relation.ispartofsjr1,814
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