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dc.contributor.authorCosta, Antonio F. B. [UNESP]
dc.identifier.citationJournal of Quality Technology, v. 31, n. 4, p. 387-397, 1999.
dc.description.abstractRecent studies have shown that the X̄ chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional X̄ chart. This article extends these studies for processes that are monitored by both the X̄ and R charts. A Markov chain model is used to determine the properties of the joint X and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint X̄ and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.en
dc.relation.ispartofJournal of Quality Technology
dc.subjectAdjusted Average Time to Signal
dc.subjectMarkov Chains
dc.subjectStatistical Process Control
dc.subjectVariable Sample Size
dc.subjectVariable Sampling Intervals
dc.titleJoint X̄ and R Charts with Variable Sample Sizes and Sampling Intervalsen
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.description.affiliationUNESP - São Paulo Stt. Univ., Guaratinguetá, 12500-000
dc.description.affiliationUnespUNESP - São Paulo Stt. Univ., Guaratinguetá, 12500-000
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