Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique
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Data
2003-03-01
Autores
Pontes, F. M.
Leal, S. H.
Pizani, P. S.
Santos, M. R M C
Leite, E. R.
Longo, Elson [UNESP]
Lanciotti, F.
Boschi, T. M.
Varela, José Arana [UNESP]
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Resumo
Strontium-modified lead titanate thin films with composition Pb1-xSrxTiO3 were grown on Pt/Ti/SiO2/Si substrates using the polymeric precursor method. The structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction. The results showed a gradual change from tetragonal to cubic structure, the transition occurring at about x = 0.58. The infrared reflectance spectra showed that the frequency of several peaks decreases as the strontium concentration increases. These features are correlated with a decrease in the tetragonal distortion of the TiO6 octahedra as the strontium concentration increases.
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Doping (additives), Fourier transform infrared spectroscopy, Lead compounds, Raman scattering, Strontium, X ray diffraction analysis, Soft chemical techniques, Thin films
Como citar
Journal of Materials Research, v. 18, n. 3, p. 659-663, 2003.