Publicação: Rietveld analyses and piezoelectric properties of niobium doped bismuth titanate systems
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Bi 4Ti 3- xNbxO 12 (BITNb) samples, with × ranging from 0 to 0.40 were obtained using a polymeric precursor solution. Rietveld analyses confirmed that the powders crystallize in an orthorhombic structure free of secondary phases with space group Fmmm. Raman analysis evidenced a sharp increase in the bands intensity located at 129 cm -1 and 190 cm -1 due the lattice distortion in BIT02Nb and BIT04Nb compositions. UV-vis spectra indicated that addition of niobium causes a reduction of defects in the BIT lattice due the suppression of oxygen vacancies located at BO-6 octahedral. Size and morphology of particles as well as electrical behavior of BIT ceramics were affected by addition of donor dopant. Polarization reversal was investigated by applying dc voltage through a conductive tip during the area scanning and was investigated by piezoresponse force microscopy (PFM). PFM measurements revealed a decrease in piezoelectric response with increasing Nb concentration originating from a reduced polarizability along the a-axis. High spontaneous polarization is noted for the less doped sample due the reduction of strain energy and pin charged defects after niobium addition. Copyright © 2010 American Scientific Publishers.
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Ceramics, Electrical Conductivity, Morphology, Piezoresponse Force Microscopy, Rietveld Analysis, Scanning Electron Microscopy, Bismuth titanate, Charged defects, DC voltage, Donor dopants, Doped sample, Electrical behaviors, Electrical conductivity, Lattice distortions, Niobium additions, Orthorhombic structures, Piezoelectric property, Piezoelectric response, Piezoresponse force microscopy, Polarizabilities, Polarization reversals, Polymeric precursor solution, Raman analysis, Secondary phasis, Sharp increase, Space Groups, Spontaneous polarizations, UV-vis spectra, Bismuth, Ceramic materials, Defects, Electric conductivity, Piezoelectricity, Polarization, Rietveld analysis, Scanning electron microscopy, Niobium
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Inglês
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Journal of Advanced Microscopy Research, v. 5, n. 2, p. 149-157, 2010.
