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Investigation of the electrical properties of SnO2 varistor system using impedance spectroscopy

dc.contributor.authorBueno, Paulo Roberto [UNESP]
dc.contributor.authorPianaro, S. A.
dc.contributor.authorPereira, E. C.
dc.contributor.authorBulhoes, LOS
dc.contributor.authorLongo, Elson [UNESP]
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)
dc.contributor.institutionUniversidade Estadual de Ponta Grossa (UEPG)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:23:27Z
dc.date.available2014-05-20T15:23:27Z
dc.date.issued1998-10-01
dc.description.abstractThe electrical properties of tin oxide varistors doped with CoO, Nb2O5 and Cr2O3, were investigated using the impedance spectroscopy technique with the temperature ranging from 25 to 400 degrees C. The impedance data, represented by means of Nyquist diagrams, show two time constants with different activation energies, one at low frequencies and the other at high frequencies. These activation energies were associated with the adsorption and reaction of O-2 species at the grain boundary interface. The Arrhenius plots show two slopes with a turnover at 200 degrees C for both the higher and lower frequency time constants. This behavior can be related with the decrease of minor charge carrier density. The barrier formation mechanism was associated with the presence of Cr-Sn at the surface, which promotes the adsorption of the O' and O species which are in turn proposed as being responsible for the barrier formation. (C) 1998 American Institute of Physics. [S0021-8979(98)04719-7]en
dc.description.affiliationUniv Fed Sao Carlos, Dept Quim, BR-13565905 Sao Carlos, SP, Brazil
dc.description.affiliationUEPG, Dept Mat Engn, BR-84031510 Ponta Grossa, PR, Brazil
dc.description.affiliationUNESP, Inst Quim, BR-14800900 Araraquara, SP, Brazil
dc.description.affiliationUnespUNESP, Inst Quim, BR-14800900 Araraquara, SP, Brazil
dc.format.extent3700-3705
dc.identifierhttp://dx.doi.org/10.1063/1.368587
dc.identifier.citationJournal of Applied Physics. Woodbury: Amer Inst Physics, v. 84, n. 7, p. 3700-3705, 1998.
dc.identifier.doi10.1063/1.368587
dc.identifier.fileWOS000076184800035.pdf
dc.identifier.issn0021-8979
dc.identifier.lattes0477045906733254
dc.identifier.orcid0000-0003-2827-0208
dc.identifier.urihttp://hdl.handle.net/11449/34241
dc.identifier.wosWOS:000076184800035
dc.language.isoeng
dc.publisherAmerican Institute of Physics (AIP)
dc.relation.ispartofJournal of Applied Physics
dc.relation.ispartofjcr2.176
dc.relation.ispartofsjr0,739
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleInvestigation of the electrical properties of SnO2 varistor system using impedance spectroscopyen
dc.typeArtigo
dcterms.licensehttp://publishing.aip.org/authors/web-posting-guidelines
dcterms.rightsHolderAmer Inst Physics
unesp.author.lattes0477045906733254[1]
unesp.author.orcid0000-0003-2827-0208[1]
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Química, Araraquarapt
unesp.departmentBioquímica e Tecnologia - IQARpt
unesp.departmentFísico-Química - IQARpt

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