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Influence of thickness on crystallization and properties of LiNbO3 thin films

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dc.contributor.authorSimoes, A. Z.
dc.contributor.authorGonzalez, AHM
dc.contributor.authorRies, A.
dc.contributor.authorZaghete, M. A.
dc.contributor.authorStojanovic, B. D.
dc.contributor.authorVarela, José Arana [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversity of Belgrade
dc.date.accessioned2014-05-20T14:18:02Z
dc.date.available2014-05-20T14:18:02Z
dc.date.issued2003-03-01
dc.description.abstractThin films of lithium niobate were deposited on Pt/Ti/SiO2 (111) substrates by spin coating from the polymeric precursor method (Pechini process). Annealing in static air was performed at 500 degreesC for 3 h. The obtained films were characterized by X-ray diffraction and atomic force microscopy. The dielectric constant, dissipation factor and resistance were measured in frequency region from 10 Hz to 10 MHz and the hysteresis loop was obtained. The influence of number of layers on crystallization, morphology and properties of LiNbO3 thin films is discussed. (C) 2003 Elsevier B.V. All rights reserved.en
dc.description.affiliationUNESP, Inst Chem, Dept Chem Phys, BR-14801970 Araraquara, SP, Brazil
dc.description.affiliationUniv Belgrade, Ctr Multidisciplinary Studies, Belgrade, Serbia Monteneg
dc.description.affiliationUnespUNESP, Inst Chem, Dept Chem Phys, BR-14801970 Araraquara, SP, Brazil
dc.format.extent239-244
dc.identifierhttp://dx.doi.org/10.1016/S1044-5803(03)00089-5
dc.identifier.citationMaterials Characterization. New York: Elsevier B.V., v. 50, n. 2-3, p. 239-244, 2003.
dc.identifier.doi10.1016/S1044-5803(03)00089-5
dc.identifier.issn1044-5803
dc.identifier.urihttp://hdl.handle.net/11449/25423
dc.identifier.wosWOS:000186249900025
dc.language.isoeng
dc.publisherElsevier B.V.
dc.relation.ispartofMaterials Characterization
dc.relation.ispartofjcr2.892
dc.relation.ispartofsjr1,291
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectLiNbO3pt
dc.subjectcrystallizationpt
dc.subjectelectrical propertiespt
dc.titleInfluence of thickness on crystallization and properties of LiNbO3 thin filmsen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderElsevier B.V.
unesp.author.lattes3573363486614904[1]
unesp.author.orcid0000-0003-2535-2187[1]
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Química, Araraquarapt
unesp.departmentFísico-Química - IQARpt

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Araraquara - IQAR - Instituto de Química