A synthetic control chart for monitoring the pprocess mean and variance

Página do item simplificado
dc.contributor.authorEpprecht, Eugenio K.
dc.contributor.authorCosta, Antonio F.B. [UNESP]
dc.contributor.authorMagalhaes, Maysa S. de
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionCatholic University of Rio de Janeiro
dc.date.accessioned2022-04-28T18:58:52Z
dc.date.accessioned2014-05-20T15:23:25Z
dc.date.available2022-04-28T18:58:52Z
dc.date.available2014-05-20T15:23:25Z
dc.date.issued2006-01-01
dc.description.abstractIn this article, we consider the synthetic control chart with two-stage sampling (SyTS chart) to control the process mean and variance. During the first stage, one item of the sample is inspected; if its value Xl is close to the target value of the process mean, then the sampling is interrupted. Otherwise, the sampling goes on to the second stage, where the remaining items are inspected and the statistic T = Σ [X1 - μ0 + ξσ0]2 is computed taking into account all items of the sample. The design parameter ξ is function of X1. When the statistic T is larger than a specified value, the sample is classified as nonconforming. According to the synthetic procedure, the signal is based on Conforming Run Length (CRL). The CRL is the number of samples taken from the process since the previous nonconforming sample until the occurrence of the next nonconforming sample. If the CRL is sufficiently small, then a signal is generated. A comparative study shows that the SyTS chart and the joint X and S charts with double sampling are very similar in performance. However, from the practical viewpoint, the SyTS chart is more convenient to administer than the joint charts.en
dc.description.affiliationENCE, Rio de Janeiro, RJ 20231050
dc.description.affiliationCatholic University of Rio de Janeiro, Rio de Janeiro, RJ 22453900
dc.description.affiliationUNESP, BR-12516410 Guaratingueta, SP, Brazil
dc.description.affiliationUnespUNESP, BR-12516410 Guaratingueta, SP, Brazil
dc.format.extent210-214
dc.identifierhttp://www.issatconferences.org/prevconf.html
dc.identifier.citation2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design, p. 210-214.
dc.identifier.citationTwelfth Issat International Conference Reliability and Quality In Design, Proceedings. Piscataway: Int Soc Sci Appl Technol, p. 210-214, 2006.
dc.identifier.scopus2-s2.0-84887549728
dc.identifier.urihttp://hdl.handle.net/11449/243679
dc.identifier.wosWOS:000241599400044
dc.language.isoeng
dc.publisherInt Soc Sci Appl Technol
dc.relation.ispartof2006 Proceedings - 12th ISSAT International Conference on Reliability and Quality in Design
dc.relation.ispartofTwelfth Issat International Conference Reliability and Quality In Design, Proceedings
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.sourceWeb of Science
dc.subjectSynthetic control charten
dc.subjectAdaptive sample size charten
dc.subjectTwo-stage samplingen
dc.subjectAverage time to signalen
dc.subjectNon-central chi-square statisticen
dc.subjectJoint monitoringen
dc.subjectSteady stateen
dc.titleA synthetic control chart for monitoring the pprocess mean and varianceen
dc.typeTrabalho apresentado em evento
dcterms.rightsHolderInt Soc Sci Appl Technol
unesp.author.lattes6100382011052492[1]
unesp.author.orcid0000-0003-2133-1098[1]

Arquivos

Coleções

Artigos