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Low energy X-ray grating interferometry at the Brazilian Synchrotron

dc.contributor.authorKoch, F. J.
dc.contributor.authorO'Dowd, F. P.
dc.contributor.authorCardoso, M. B.
dc.contributor.authorDa Silva, R. R. [UNESP]
dc.contributor.authorCavicchioli, M. [UNESP]
dc.contributor.authorRibeiro, S. J.L. [UNESP]
dc.contributor.authorSchröter, T. J.
dc.contributor.authorFaisal, A.
dc.contributor.authorMeyer, P.
dc.contributor.authorKunka, D.
dc.contributor.authorMohr, J.
dc.contributor.institutionKarlsruhe Institute of Technology
dc.contributor.institutionBrazilian Synchrotron Light Laboratory
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2018-12-11T16:46:06Z
dc.date.available2018-12-11T16:46:06Z
dc.date.issued2017-06-15
dc.description.abstractGrating based X-ray differential phase contrast imaging has found a large variety of applications in the last decade. Different types of samples call for different imaging energies, and efforts have been made to establish the technique all over the spectrum used for conventional X-ray imaging. Here we present a two-grating interferometer working at 8.3 keV, implemented at the bending magnet source of the IMX beamline of the Brazilian Synchrotron Light Laboratory. The low design energy is made possible by gratings fabricated on polymer substrates, and makes the interferometer mainly suited to the investigation of light and thin samples. We investigate polymer microspheres filled with Fe2O3 nanoparticles, and find that these particles give rise to a significant visibility reduction due to small angle scattering.en
dc.description.affiliationInstitute of Microstructure Technology Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1
dc.description.affiliationBrazilian Synchrotron Light Laboratory
dc.description.affiliationInstitute of Chemistry – São Paulo State University – UNESP, CP 355
dc.description.affiliationUnespInstitute of Chemistry – São Paulo State University – UNESP, CP 355
dc.format.extent195-198
dc.identifierhttp://dx.doi.org/10.1016/j.optcom.2017.02.055
dc.identifier.citationOptics Communications, v. 393, p. 195-198.
dc.identifier.doi10.1016/j.optcom.2017.02.055
dc.identifier.file2-s2.0-85013766776.pdf
dc.identifier.issn0030-4018
dc.identifier.scopus2-s2.0-85013766776
dc.identifier.urihttp://hdl.handle.net/11449/169488
dc.language.isoeng
dc.relation.ispartofOptics Communications
dc.relation.ispartofsjr0,614
dc.rights.accessRightsAcesso abertopt
dc.sourceScopus
dc.subjectGrating interferometry
dc.subjectNanocrystals
dc.subjectOptics
dc.subjectX-ray
dc.titleLow energy X-ray grating interferometry at the Brazilian Synchrotronen
dc.typeArtigopt
dspace.entity.typePublication
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Química, Araraquarapt

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