What is the Importance of Selecting Features for Non-Technical Losses Identif cation?

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dc.contributor.authorRamos, Caio C. O.
dc.contributor.authorPapa, Joao P. [UNESP]
dc.contributor.authorSouza, Andre N. [UNESP]
dc.contributor.authorChiachia, Giovani
dc.contributor.authorFalcao, Alexandre X.
dc.contributor.authorIEEE
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.date.accessioned2020-12-10T22:02:28Z
dc.date.available2020-12-10T22:02:28Z
dc.date.issued2011-01-01
dc.description.abstractAlthough non-technical losses automatic identif cation has been massively studied, the problem of selecting the most representative features in order to boost the identif cation accuracy has not attracted much attention in this context. In this paper, we focus on this problem applying a novel feature selection algorithm based on Particle Swarm Optimization and Optimum-Path Forest. The results demonstrated that this method can improve the classif cation accuracy of possible frauds up to 49% in some datasets composed by industrial and commercial prof les.en
dc.description.affiliationUniv Sao Paulo, Dept Elect Engn, Sao Paulo, Brazil
dc.description.affiliationSao Paulo State Univ, UNESP, Dept Comp, Sao Paulo, Brazil
dc.description.affiliationSao Paulo State Univ, UNESP, Dept Elect Engn, Sao Paulo, Brazil
dc.description.affiliationUniv Estadual Campinas, Inst Comp, Sao Paulo, Brazil
dc.description.affiliationUnespSao Paulo State Univ, UNESP, Dept Comp, Sao Paulo, Brazil
dc.description.affiliationUnespSao Paulo State Univ, UNESP, Dept Elect Engn, Sao Paulo, Brazil
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipIdFAPESP: 2009/16206-1
dc.format.extent1045-1048
dc.identifier.citation2011 Ieee International Symposium On Circuits And Systems (iscas). New York: Ieee, p. 1045-1048, 2011.
dc.identifier.issn0271-4302
dc.identifier.urihttp://hdl.handle.net/11449/197407
dc.identifier.wosWOS:000297265301069
dc.language.isoeng
dc.publisherIeee
dc.relation.ispartof2011 Ieee International Symposium On Circuits And Systems (iscas)
dc.sourceWeb of Science
dc.titleWhat is the Importance of Selecting Features for Non-Technical Losses Identif cation?en
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIeee
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Ciências, Baurupt
unesp.departmentComputação - FCpt

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