New method for self-heating estimation using only DC measurements
dc.contributor.author | Mori, C. A.B. | |
dc.contributor.author | Agopian, P. G.D. [UNESP] | |
dc.contributor.author | Martino, J. A. | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.date.accessioned | 2018-12-11T16:54:46Z | |
dc.date.available | 2018-12-11T16:54:46Z | |
dc.date.issued | 2018-05-03 | |
dc.description.abstract | This paper reports a new method for estimating the thermal resistance of a device using the inverse of the transistor efficiency as a function of the power applied to the transistor's channel. The advantages of this new method are the use of DC measurements only and errors smaller than 4% in the estimation of the channel temperature increase due to the SHE when compared to a pulsed method for the UTBB SOI studied in this work. | en |
dc.description.affiliation | LSI/PSI/USP University of Sao Paulo | |
dc.description.affiliation | Sao Paulo State University (UNESP) | |
dc.description.affiliationUnesp | Sao Paulo State University (UNESP) | |
dc.format.extent | 1-4 | |
dc.identifier | http://dx.doi.org/10.1109/ULIS.2018.8354756 | |
dc.identifier.citation | 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018, v. 2018-January, p. 1-4. | |
dc.identifier.doi | 10.1109/ULIS.2018.8354756 | |
dc.identifier.lattes | 0496909595465696 | |
dc.identifier.orcid | 0000-0002-0886-7798 | |
dc.identifier.scopus | 2-s2.0-85050906462 | |
dc.identifier.uri | http://hdl.handle.net/11449/171293 | |
dc.language.iso | eng | |
dc.relation.ispartof | 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2018 | |
dc.rights.accessRights | Acesso restrito | |
dc.source | Scopus | |
dc.subject | Self-heating effect | |
dc.subject | Silicon-On-Insulator | |
dc.subject | UTBB | |
dc.title | New method for self-heating estimation using only DC measurements | en |
dc.type | Trabalho apresentado em evento | |
unesp.author.lattes | 0496909595465696[2] | |
unesp.author.orcid | 0000-0002-0886-7798[2] |