Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures
dc.contributor.author | Tokumoto, M. S. | |
dc.contributor.author | Smith, A. | |
dc.contributor.author | Santilli, Celso Valentim [UNESP] | |
dc.contributor.author | Pulcinelli, Sandra Helena [UNESP] | |
dc.contributor.author | Craievich, A. F. | |
dc.contributor.author | Elkaim, E. | |
dc.contributor.author | Traverse, A. | |
dc.contributor.author | Briois, V | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.contributor.institution | ENSCI | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.contributor.institution | UPS | |
dc.date.accessioned | 2014-05-20T15:24:37Z | |
dc.date.available | 2014-05-20T15:24:37Z | |
dc.date.issued | 2002-09-02 | |
dc.description.abstract | The influence of the substrate temperature on the structural features and opto-electrical properties of undoped and indium-doped ZnO thin films deposited by pyrosol process was investigated. The addition of indium induces a drastic decrease (by a factor approximate to 10(10) for samples deposited at 300 degreesC) in the electrical resistivity of films, the lowest electrical resistivity (6 mOmega-cm) being observed for the film deposited at 450 degreesC. Films are highly transparent (>80%) in the Vis-NIR ranges, and the optical band gap exhibits a blue shift (from 3.29 to 3.33 eV) for the In-doped films deposited at increasing temperature. Preferential orientation of the ZnO crystallites with the c-axis perpendicular to the substrate surface and an anisotropic morphology of the nanoporous structure was observed for films growth at 300 and 350 degreesC. (C) 2002 Elsevier B.V. B.V. All rights reserved. | en |
dc.description.affiliation | UNESP, Inst Quim, BR-14800970 Araraquara, SP, Brazil | |
dc.description.affiliation | ENSCI, GEMH, F-87065 Limoges, France | |
dc.description.affiliation | USP, Inst Fis, BR-13083970 São Paulo, SP, Brazil | |
dc.description.affiliation | UPS, LURE, F-91898 Orsay, France | |
dc.description.affiliationUnesp | UNESP, Inst Quim, BR-14800970 Araraquara, SP, Brazil | |
dc.format.extent | 284-293 | |
dc.identifier | http://dx.doi.org/10.1016/S0040-6090(02)00531-X | |
dc.identifier.citation | Thin Solid Films. Lausanne: Elsevier B.V. Sa, v. 416, n. 1-2, p. 284-293, 2002. | |
dc.identifier.doi | 10.1016/S0040-6090(02)00531-X | |
dc.identifier.issn | 0040-6090 | |
dc.identifier.lattes | 5584298681870865 | |
dc.identifier.lattes | 9971202585286967 | |
dc.identifier.orcid | 0000-0002-8356-8093 | |
dc.identifier.uri | http://hdl.handle.net/11449/35200 | |
dc.identifier.wos | WOS:000178582700043 | |
dc.language.iso | eng | |
dc.publisher | Elsevier B.V. | |
dc.relation.ispartof | Thin Solid Films | |
dc.relation.ispartofjcr | 1.939 | |
dc.relation.ispartofsjr | 0,617 | |
dc.rights.accessRights | Acesso restrito | |
dc.source | Web of Science | |
dc.subject | electrical properties | pt |
dc.subject | nanostructures | pt |
dc.subject | optical coatings | pt |
dc.subject | zinc oxide | pt |
dc.title | Structural electrical and optical properties of undoped and indium doped ZnO thin films prepared by the pyrosol process at different temperatures | en |
dc.type | Artigo | |
dcterms.license | http://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy | |
dcterms.rightsHolder | Elsevier B.V. | |
unesp.author.lattes | 9971202585286967 | |
unesp.author.lattes | 5584298681870865[3] | |
unesp.author.orcid | 0000-0002-8356-8093[3] | |
unesp.campus | Universidade Estadual Paulista (Unesp), Instituto de Química, Araraquara | pt |
unesp.department | Físico-Química - IQAR | pt |
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