Preparation of films from aluminum acetylacetonate by plasma sputtering
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2013-07-01
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Aluminum acetylacetonate has been reported as a precursor for the deposition of alumina films using different approaches. In this work, alumina-containing films were prepared by plasma sputtering this compound, spread directly on the powered lowermost electrode of a reactor, while grounding the substrates mounted on the topmost electrode. Radiofrequency power (13.56 MHz) was used to excite the plasma from argon atmosphere at a working pressure of 11 Pa. The effect of the plasma excitation power on the properties of the resulting films was studied. Film thickness and hardness were measured by profilometry and nanoindentation, respectively. The molecular structure and chemical composition of the layers were analyzed by Fourier transform infrared spectroscopy and energy dispersive spectroscopy. Surface micrographs, obtained by scanning electron microscopy, allowed the determination of the sample morphology. Grazing incidence X-ray diffraction was employed to determine the structure of the films. Amorphous organic layers were deposited with thicknesses of up to 7 μm and hardness of around 1.0 GPa. The films were composed by aluminum, carbon, oxygen and hydrogen, their proportions being strongly dependent on the power used to excite the plasma. A uniform surface was obtained for low-power depositions, but particulates and cracks appeared in the high-power prepared materials. The presence of different proportions of aluminum oxide in the coatings is ascribed to the different activations promoted in the metalorganic molecule once in the plasma phase. Copyright © 2013 John Wiley & Sons, Ltd. Copyright © 2013 John Wiley & Sons, Ltd.
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aluminum acetylacetonate, aluminum oxide, plasma sputtering, thin films, Aluminum acetylacetonate, Aluminum oxides, Chemical compositions, Different proportions, Grazing incidence X-ray diffraction, Plasma sputtering, Radio-frequency power, Sample morphology, Alumina, Aluminum, Aluminum coatings, Carbon films, Deposition, Energy dispersive spectroscopy, Fourier transform infrared spectroscopy, Hardening, Hardness, Plasmas, Scanning electron microscopy, Thin films, X ray diffraction, Film preparation
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Inglês
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Surface and Interface Analysis, v. 45, n. 7, p. 1113-1118, 2013.
