Atomic Force Microscopy: A Powerful Tool for Electrical Characterization

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dc.contributor.authorTararam, Ronald [UNESP]
dc.contributor.authorGarcia, Pâmela S.
dc.contributor.authorDeda, Daiana K.
dc.contributor.authorVarela, José A. [UNESP]
dc.contributor.authorde Lima Leite, Fábio
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)
dc.date.accessioned2022-04-30T05:15:59Z
dc.date.available2022-04-30T05:15:59Z
dc.date.issued2017-03-23
dc.description.abstractThe fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM).en
dc.description.affiliationMultidisciplinary Center for the Development of Ceramic Materials São Paulo State University
dc.description.affiliationFederal University of São Carlos
dc.description.affiliationUnespMultidisciplinary Center for the Development of Ceramic Materials São Paulo State University
dc.format.extent37-64
dc.identifierhttp://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3
dc.identifier.citationNanocharacterization Techniques, p. 37-64.
dc.identifier.doi10.1016/B978-0-323-49778-7.00002-3
dc.identifier.scopus2-s2.0-85040575407
dc.identifier.urihttp://hdl.handle.net/11449/232701
dc.language.isoeng
dc.relation.ispartofNanocharacterization Techniques
dc.sourceScopus
dc.subjectAtomic force microscopy
dc.subjectElectrostatic force microscopy (EFM)
dc.subjectIntermittent contact
dc.subjectNanocharacterization
dc.subjectSpatial resolution
dc.subjectTopographical image
dc.titleAtomic Force Microscopy: A Powerful Tool for Electrical Characterizationen
dc.typeCapítulo de livro
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Química, Araraquarapt
unesp.departmentFísico-Química - IQARpt

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Araraquara - IQAR - Instituto de Química