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Publicação:
Characteristics of a resonant iris microwave-induced nitrogen plasma

dc.contributor.authorGoncalves, Daniel A. [UNESP]
dc.contributor.authorMcSweeney, Tina
dc.contributor.authorDonati, George L.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionAgilent Technologies
dc.contributor.institutionBox 7486
dc.date.accessioned2018-12-11T16:42:42Z
dc.date.available2018-12-11T16:42:42Z
dc.date.issued2016-05-01
dc.description.abstractIn this work, we use the Boltzmann plot, Saha's equation and the Mg II/Mg I signal ratio to determine temperature (T), electron number density (ne) and robustness of different regions of a microwave-induced nitrogen plasma. A 2-D profile based on plasma observation position and nebulization flow rate is generated for each of these properties and their effects on sensitivity, accuracy and matrix-related interferences in microwave-induced plasma optical emission spectrometry (MIP OES) are evaluated. Plasma temperatures vary between 4220 and 5360 K by changing nebulization flow rate and plasma observation position. These same instrumental parameters are varied to produce ne values in the 0.47-3.72 × 1013 cm-3 range, and Mg II/Mg I ratios between 0.26 and 2.01. Limits of detection (LODs) were calculated for different T and ne conditions, and for analytes with a wide range of Esum values (Esum = ionization energy + excitation energy). The best LODs were calculated for determinations at high ne plasma regions. More robust plasma conditions allowed for more accurate results when determining analytes with Esum > 9 eV or < 3 eV. For intermediate Esum elements, the best recoveries in complex sample analyses were obtained at high ne conditions. Although the microwave applied power is fixed at 1000 W for the commercial MIP OES evaluated, one can still control plasma conditions by varying other operating parameters, which may contribute to fewer matrix effects, better accuracies and lower LODs.en
dc.description.affiliationDepartment of Physics and Chemistry UNESP-Univ Estadual Paulista, Av. Brasil, 56
dc.description.affiliationAgilent Technologies, 2500 Regency Parkway
dc.description.affiliationDepartment of Chemistry Wake Forest University Salem Hall Box 7486
dc.description.affiliationUnespDepartment of Physics and Chemistry UNESP-Univ Estadual Paulista, Av. Brasil, 56
dc.description.sponsorshipAgilent Technologies
dc.description.sponsorshipWake Forest University
dc.format.extent1097-1104
dc.identifierhttp://dx.doi.org/10.1039/c6ja00066e
dc.identifier.citationJournal of Analytical Atomic Spectrometry, v. 31, n. 5, p. 1097-1104, 2016.
dc.identifier.doi10.1039/c6ja00066e
dc.identifier.issn1364-5544
dc.identifier.issn0267-9477
dc.identifier.scopus2-s2.0-84973652285
dc.identifier.urihttp://hdl.handle.net/11449/168721
dc.language.isoeng
dc.relation.ispartofJournal of Analytical Atomic Spectrometry
dc.relation.ispartofsjr1,066
dc.rights.accessRightsAcesso restritopt
dc.sourceScopus
dc.titleCharacteristics of a resonant iris microwave-induced nitrogen plasmaen
dc.typeArtigopt
dspace.entity.typePublication
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Engenharia, Ilha Solteirapt

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