Abnormal resistive switching in electrodeposited Prussian White thin films

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dc.contributor.authorFaita, F. L.
dc.contributor.authorAvila, L. B.
dc.contributor.authorSilva, J. P.B.
dc.contributor.authorBoratto, M. H. [UNESP]
dc.contributor.authorCid, C.C. Plá
dc.contributor.authorGraeff, C. F.O. [UNESP]
dc.contributor.authorGomes, M. J.M.
dc.contributor.authorMüller, C. K.
dc.contributor.authorPasa, A. A.
dc.contributor.institutionUniversidade Federal do Rio Grande do Sul
dc.contributor.institutionUniversidade Federal de Santa Catarina (UFSC)
dc.contributor.institutionCentre of Physics of Minho and Porto Universities (CF-UM-UP)
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.contributor.institutionFaculty of Physical Engineering/Computer Sciences
dc.date.accessioned2022-04-28T19:47:50Z
dc.date.available2022-04-28T19:47:50Z
dc.date.issued2022-03-10
dc.description.abstractPrussian White (PW) layers were deposited on Au/Cr/Si substrates by electrodeposition and characterized by different techniques. Scanning electron microscopy (SEM) images and Raman mapping reveal a uniform and homogeneous deposit while scanning transmission electron microscopy (STEM) images disclose the grain boundary pattern and the thickness of 300 nm of the PW layer. Resistive switching (RS) effect with an ON/OFF ratio of about 102 was observed. The RS mechanism was investigated from the log-log current-voltage plots. Ionic conduction was observed with an activation energy of 0.4 eV that could be associated with potassium ions as possible charge carriers at the grain boundaries. The endurance characteristics were investigated and a stable abnormal RS was observed for consecutive 500 cycles. Moreover, the retention was also evaluated and the high resistive state (HRS) and low resistive state (LRS) were stable up to 1000 s.en
dc.description.affiliationInstituto de Física Universidade Federal do Rio Grande do Sul
dc.description.affiliationDepartamento de Física Universidade Federal de Santa Catarina
dc.description.affiliationCentre of Physics of Minho and Porto Universities (CF-UM-UP) Campus de Gualtar
dc.description.affiliationSão Paulo State University (UNESP) School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology
dc.description.affiliationUniversity of Applied Sciences Zwickau Faculty of Physical Engineering/Computer Sciences
dc.description.affiliationUnespSão Paulo State University (UNESP) School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipFinanciadora de Estudos e Projetos
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipDeutscher Akademischer Austauschdienst
dc.description.sponsorshipIdCAPES: 001
dc.description.sponsorshipIdFAPESP: 2013/07296
dc.description.sponsorshipIdFAPESP: 2017/20809-0
dc.description.sponsorshipIdFAPESP: 2020/04721-8
dc.description.sponsorshipIdDeutscher Akademischer Austauschdienst: 249302
dc.identifierhttp://dx.doi.org/10.1016/j.jallcom.2021.162971
dc.identifier.citationJournal of Alloys and Compounds, v. 896.
dc.identifier.doi10.1016/j.jallcom.2021.162971
dc.identifier.issn0925-8388
dc.identifier.scopus2-s2.0-85120471979
dc.identifier.urihttp://hdl.handle.net/11449/222973
dc.language.isoeng
dc.relation.ispartofJournal of Alloys and Compounds
dc.sourceScopus
dc.subjectElectrodeposition
dc.subjectPrussian White
dc.subjectResistive switching
dc.titleAbnormal resistive switching in electrodeposited Prussian White thin filmsen
dc.typeArtigo

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