Abnormal resistive switching in electrodeposited Prussian White thin films
dc.contributor.author | Faita, F. L. | |
dc.contributor.author | Avila, L. B. | |
dc.contributor.author | Silva, J. P.B. | |
dc.contributor.author | Boratto, M. H. [UNESP] | |
dc.contributor.author | Cid, C.C. Plá | |
dc.contributor.author | Graeff, C. F.O. [UNESP] | |
dc.contributor.author | Gomes, M. J.M. | |
dc.contributor.author | Müller, C. K. | |
dc.contributor.author | Pasa, A. A. | |
dc.contributor.institution | Universidade Federal do Rio Grande do Sul | |
dc.contributor.institution | Universidade Federal de Santa Catarina (UFSC) | |
dc.contributor.institution | Centre of Physics of Minho and Porto Universities (CF-UM-UP) | |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | |
dc.contributor.institution | Faculty of Physical Engineering/Computer Sciences | |
dc.date.accessioned | 2022-04-28T19:47:50Z | |
dc.date.available | 2022-04-28T19:47:50Z | |
dc.date.issued | 2022-03-10 | |
dc.description.abstract | Prussian White (PW) layers were deposited on Au/Cr/Si substrates by electrodeposition and characterized by different techniques. Scanning electron microscopy (SEM) images and Raman mapping reveal a uniform and homogeneous deposit while scanning transmission electron microscopy (STEM) images disclose the grain boundary pattern and the thickness of 300 nm of the PW layer. Resistive switching (RS) effect with an ON/OFF ratio of about 102 was observed. The RS mechanism was investigated from the log-log current-voltage plots. Ionic conduction was observed with an activation energy of 0.4 eV that could be associated with potassium ions as possible charge carriers at the grain boundaries. The endurance characteristics were investigated and a stable abnormal RS was observed for consecutive 500 cycles. Moreover, the retention was also evaluated and the high resistive state (HRS) and low resistive state (LRS) were stable up to 1000 s. | en |
dc.description.affiliation | Instituto de Física Universidade Federal do Rio Grande do Sul | |
dc.description.affiliation | Departamento de Física Universidade Federal de Santa Catarina | |
dc.description.affiliation | Centre of Physics of Minho and Porto Universities (CF-UM-UP) Campus de Gualtar | |
dc.description.affiliation | São Paulo State University (UNESP) School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology | |
dc.description.affiliation | University of Applied Sciences Zwickau Faculty of Physical Engineering/Computer Sciences | |
dc.description.affiliationUnesp | São Paulo State University (UNESP) School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology | |
dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
dc.description.sponsorship | Financiadora de Estudos e Projetos | |
dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) | |
dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
dc.description.sponsorship | Deutscher Akademischer Austauschdienst | |
dc.description.sponsorshipId | CAPES: 001 | |
dc.description.sponsorshipId | FAPESP: 2013/07296 | |
dc.description.sponsorshipId | FAPESP: 2017/20809-0 | |
dc.description.sponsorshipId | FAPESP: 2020/04721-8 | |
dc.description.sponsorshipId | Deutscher Akademischer Austauschdienst: 249302 | |
dc.identifier | http://dx.doi.org/10.1016/j.jallcom.2021.162971 | |
dc.identifier.citation | Journal of Alloys and Compounds, v. 896. | |
dc.identifier.doi | 10.1016/j.jallcom.2021.162971 | |
dc.identifier.issn | 0925-8388 | |
dc.identifier.scopus | 2-s2.0-85120471979 | |
dc.identifier.uri | http://hdl.handle.net/11449/222973 | |
dc.language.iso | eng | |
dc.relation.ispartof | Journal of Alloys and Compounds | |
dc.source | Scopus | |
dc.subject | Electrodeposition | |
dc.subject | Prussian White | |
dc.subject | Resistive switching | |
dc.title | Abnormal resistive switching in electrodeposited Prussian White thin films | en |
dc.type | Artigo |