Bandgap voltage reference with low susceptibility to electromagnetic interference (EMI)

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dc.contributor.authorDe Souza, Flávio Queiroz [UNESP]
dc.contributor.authorOki, Nobuo [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-27T11:26:06Z
dc.date.available2014-05-27T11:26:06Z
dc.date.issued2011-10-25
dc.description.abstractIn this paper, the susceptibility of a current-mode bandgap voltage reference to electromagnetic interference (EMI) superimposed to the power supply is investigated by simulation. Designed for AMS 0.35 CMOS process, the circuit provides a stable voltage reference in the temperature range of -40-150°C. When EMI disturbances are present, the circuit exhibits only 6.7 mV of offset for interfering signals in the frequency range of 150 kHz-1 GHz. © 2011 ACM.en
dc.description.affiliationDepartamento de Engenharia Elétrica Faculdade de Engenharia de Ilha Solteira-FEIS Universidade Estadual Paulista - UNESP, Avenida Brasil, 56, Centro - Ilha Solteira - SP
dc.description.affiliationUnespDepartamento de Engenharia Elétrica Faculdade de Engenharia de Ilha Solteira-FEIS Universidade Estadual Paulista - UNESP, Avenida Brasil, 56, Centro - Ilha Solteira - SP
dc.format.extent51-54
dc.identifierhttp://dx.doi.org/10.1145/2020876.2020889
dc.identifier.citationProceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Design, p. 51-54.
dc.identifier.doi10.1145/2020876.2020889
dc.identifier.lattes1525717947689076
dc.identifier.scopus2-s2.0-80054785710
dc.identifier.urihttp://hdl.handle.net/11449/72757
dc.language.isoeng
dc.relation.ispartofProceedings - SBCCI2011: 24th Symposium on Integrated Circuits and Systems Design
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectbandgap
dc.subjectcurrent-mode voltage reference.
dc.subjectelectromagnetic interference
dc.subjectemi
dc.subjectsusceptibility
dc.subjectvoltage reference
dc.subject0.35 CMOS
dc.subjectBandgap voltage reference
dc.subjectCurrent mode
dc.subjectFrequency ranges
dc.subjectInterfering signals
dc.subjectPower supply
dc.subjectTemperature range
dc.subjectCMOS integrated circuits
dc.subjectElectromagnetic pulse
dc.subjectElectromagnetic wave interference
dc.subjectElectromagnetism
dc.subjectEnergy gap
dc.subjectIntegrated circuits
dc.subjectSignal interference
dc.subjectSystems analysis
dc.subjectVoltage measurement
dc.titleBandgap voltage reference with low susceptibility to electromagnetic interference (EMI)en
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://www.acm.org/publications/copyright-statement
unesp.author.lattes1525717947689076
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Engenharia, Ilha Solteirapt
unesp.departmentEngenharia Elétrica - FEISpt

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Ilha Solteira - FEIS - Faculdade de Engenharia