Investigation of microwave dielectric relaxation solid state process in the antiferroelectric phase of NaNbO3 ceramics
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2004-08-01
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Elsevier B.V.
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This letter reports microwave dielectric measurements performed in the antiferroelectric phase of NaNbO3 ceramics from 100 to 450 K. Remarkable dielectric relaxation was found within the antiferroelectric phase and in the vicinity of the ferroelectric-antiferroelectric phase transition. Such dielectric relaxation process was associated with relaxations of polar nanoregions with strong relaxor-like characteristic. In addition, the microwave dielectric measurements also revealed an unexpected and unusual anomaly in the relaxation strength, which was related to a disruption of the antiferroelectric order induced by a possible AFE-AFE phase transition. (C) 2004 Elsevier Ltd. All rights reserved.
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Solid State Communications. Oxford: Pergamon-Elsevier B.V., v. 131, n. 5, p. 279-282, 2004.