Direct Observation of Tetragonal Distortion in Epitaxial Structures through Secondary Peak Split in a Synchrotron Radiation Renninger Scan
dc.contributor.author | de Menezes, Alan S. | |
dc.contributor.author | dos Santos, Adenilson O. | |
dc.contributor.author | Almeida, Juliana M. A. | |
dc.contributor.author | Bortoleto, Jose R. R. [UNESP] | |
dc.contributor.author | Cotta, Monica A. | |
dc.contributor.author | Morelhao, Sergio L. | |
dc.contributor.author | Cardoso, Lisandro P. | |
dc.contributor.institution | Universidade Federal do Maranhão (UFMA) | |
dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | |
dc.contributor.institution | Universidade Federal de Sergipe (UFS) | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.date.accessioned | 2014-05-20T13:12:14Z | |
dc.date.available | 2014-05-20T13:12:14Z | |
dc.date.issued | 2010-08-01 | |
dc.description.abstract | This paper reports a direct observation of an interesting split of the (022)(022) four-beam secondary peak into two (022) and (022) three-beam peaks, in a synchrotron radiation Renninger scan (phi-scan), as an evidence of the layer tetragonal distortion in two InGaP/GaAs (001) epitaxial structures with different thicknesses. The thickness, composition, (a perpendicular to) perpendicular lattice parameter, and (01) in-plane lattice parameter of the two epitaxial ternary layers were obtained from rocking curves (omega-scan) as well as from the simulation of the (022)(022) split, and then, it allowed for the determination of the perpendicular and parallel (in-plane) strains. Furthermore, (022)(022) omega:phi mappings were measured in order to exhibit the multiple diffraction condition of this four-beam case with their split measurement. | en |
dc.description.affiliation | Universidade Federal do Maranhão (UFMA), CCSST, BR-65900410 Imperatriz, MA, Brazil | |
dc.description.affiliation | Univ Estadual Campinas, IFGW, BR-13083970 Campinas, SP, Brazil | |
dc.description.affiliation | Univ Fed Sergipe, Nucleo Fis, BR-49500000 Itabaiana, SE, Brazil | |
dc.description.affiliation | Unesp, Engn Controle & Automacao, BR-18087180 Sorocaba, SP, Brazil | |
dc.description.affiliation | Univ São Paulo, Inst Fis, BR-05315970 São Paulo, Brazil | |
dc.description.affiliationUnesp | Unesp, Engn Controle & Automacao, BR-18087180 Sorocaba, SP, Brazil | |
dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) | |
dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
dc.description.sponsorshipId | FAPESP: 07/08609-3 | |
dc.format.extent | 3436-3441 | |
dc.identifier | http://dx.doi.org/10.1021/cg100146x | |
dc.identifier.citation | Crystal Growth & Design. Washington: Amer Chemical Soc, v. 10, n. 8, p. 3436-3441, 2010. | |
dc.identifier.doi | 10.1021/cg100146x | |
dc.identifier.issn | 1528-7483 | |
dc.identifier.uri | http://hdl.handle.net/11449/223 | |
dc.identifier.wos | WOS:000280471700024 | |
dc.language.iso | eng | |
dc.publisher | Amer Chemical Soc | |
dc.relation.ispartof | Crystal Growth & Design | |
dc.relation.ispartofjcr | 3.972 | |
dc.relation.ispartofsjr | 1,154 | |
dc.rights.accessRights | Acesso restrito | |
dc.source | Web of Science | |
dc.title | Direct Observation of Tetragonal Distortion in Epitaxial Structures through Secondary Peak Split in a Synchrotron Radiation Renninger Scan | en |
dc.type | Artigo | |
dcterms.license | http://pubs.acs.org/page/copyright/journals/faqs.html | |
dcterms.rightsHolder | Amer Chemical Soc | |
unesp.campus | Universidade Estadual Paulista (Unesp), Instituto de Ciência e Tecnologia, Sorocaba | pt |
unesp.department | Engenharia de Controle e Automação - ICTS | pt |
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