Direct Observation of Tetragonal Distortion in Epitaxial Structures through Secondary Peak Split in a Synchrotron Radiation Renninger Scan

dc.contributor.authorde Menezes, Alan S.
dc.contributor.authordos Santos, Adenilson O.
dc.contributor.authorAlmeida, Juliana M. A.
dc.contributor.authorBortoleto, Jose R. R. [UNESP]
dc.contributor.authorCotta, Monica A.
dc.contributor.authorMorelhao, Sergio L.
dc.contributor.authorCardoso, Lisandro P.
dc.contributor.institutionUniversidade Federal do Maranhão (UFMA)
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.contributor.institutionUniversidade Federal de Sergipe (UFS)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2014-05-20T13:12:14Z
dc.date.available2014-05-20T13:12:14Z
dc.date.issued2010-08-01
dc.description.abstractThis paper reports a direct observation of an interesting split of the (022)(022) four-beam secondary peak into two (022) and (022) three-beam peaks, in a synchrotron radiation Renninger scan (phi-scan), as an evidence of the layer tetragonal distortion in two InGaP/GaAs (001) epitaxial structures with different thicknesses. The thickness, composition, (a perpendicular to) perpendicular lattice parameter, and (01) in-plane lattice parameter of the two epitaxial ternary layers were obtained from rocking curves (omega-scan) as well as from the simulation of the (022)(022) split, and then, it allowed for the determination of the perpendicular and parallel (in-plane) strains. Furthermore, (022)(022) omega:phi mappings were measured in order to exhibit the multiple diffraction condition of this four-beam case with their split measurement.en
dc.description.affiliationUniversidade Federal do Maranhão (UFMA), CCSST, BR-65900410 Imperatriz, MA, Brazil
dc.description.affiliationUniv Estadual Campinas, IFGW, BR-13083970 Campinas, SP, Brazil
dc.description.affiliationUniv Fed Sergipe, Nucleo Fis, BR-49500000 Itabaiana, SE, Brazil
dc.description.affiliationUnesp, Engn Controle & Automacao, BR-18087180 Sorocaba, SP, Brazil
dc.description.affiliationUniv São Paulo, Inst Fis, BR-05315970 São Paulo, Brazil
dc.description.affiliationUnespUnesp, Engn Controle & Automacao, BR-18087180 Sorocaba, SP, Brazil
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipIdFAPESP: 07/08609-3
dc.format.extent3436-3441
dc.identifierhttp://dx.doi.org/10.1021/cg100146x
dc.identifier.citationCrystal Growth & Design. Washington: Amer Chemical Soc, v. 10, n. 8, p. 3436-3441, 2010.
dc.identifier.doi10.1021/cg100146x
dc.identifier.issn1528-7483
dc.identifier.urihttp://hdl.handle.net/11449/223
dc.identifier.wosWOS:000280471700024
dc.language.isoeng
dc.publisherAmer Chemical Soc
dc.relation.ispartofCrystal Growth & Design
dc.relation.ispartofjcr3.972
dc.relation.ispartofsjr1,154
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleDirect Observation of Tetragonal Distortion in Epitaxial Structures through Secondary Peak Split in a Synchrotron Radiation Renninger Scanen
dc.typeArtigo
dcterms.licensehttp://pubs.acs.org/page/copyright/journals/faqs.html
dcterms.rightsHolderAmer Chemical Soc
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Ciência e Tecnologia, Sorocabapt
unesp.departmentEngenharia de Controle e Automação - ICTSpt

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