Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films
dc.contributor.author | Lima, E. C. | |
dc.contributor.author | Araujo, E. B. [UNESP] | |
dc.contributor.author | Bdikin, I. K. | |
dc.contributor.author | Kholkin, A. L. | |
dc.contributor.institution | Universidade Federal do Tocantins (UFT) | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.contributor.institution | Univ Aveiro | |
dc.date.accessioned | 2014-12-03T13:11:51Z | |
dc.date.available | 2014-12-03T13:11:51Z | |
dc.date.issued | 2014-06-11 | |
dc.description.abstract | PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena. | en |
dc.description.affiliation | Univ Fed Tocantins, Porto Nacl, TO, Brazil | |
dc.description.affiliation | UNESP Univ Estadual Paulista, Fac Engn Ilha Solteira, Dept Fis & Quim, BR-15385000 Ilha Solteira, SP, Brazil | |
dc.description.affiliation | Univ Aveiro, Dept Mech Engn, P-3810193 Aveiro, Portugal | |
dc.description.affiliation | Univ Aveiro, TEMA, P-3810193 Aveiro, Portugal | |
dc.description.affiliation | Univ Aveiro, Dept Mat & Ceram Engn, P-3810193 Aveiro, Portugal | |
dc.description.affiliation | Univ Aveiro, CICECO, P-3810193 Aveiro, Portugal | |
dc.description.affiliationUnesp | UNESP Univ Estadual Paulista, Fac Engn Ilha Solteira, Dept Fis & Quim, BR-15385000 Ilha Solteira, SP, Brazil | |
dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
dc.description.sponsorship | Center for Research on Ceramic and Composite materials (CICECO) of the University of Aveiro | |
dc.description.sponsorshipId | FAPESP: 13/12642-7 | |
dc.description.sponsorshipId | FAPESP: 10/16504-0 | |
dc.description.sponsorshipId | FAPESP: 07/08534-3 | |
dc.description.sponsorshipId | CNPq: 305973/2012-6 | |
dc.description.sponsorshipId | Center for Research on Ceramic and Composite materials (CICECO) of the University of AveiroPEst-C/CTM/LA0011/2013 | |
dc.format.extent | 106-114 | |
dc.identifier | http://dx.doi.org/10.1080/00150193.2014.894391 | |
dc.identifier.citation | Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 465, n. 1, p. 106-114, 2014. | |
dc.identifier.doi | 10.1080/00150193.2014.894391 | |
dc.identifier.issn | 0015-0193 | |
dc.identifier.lattes | 6725982228402054 | |
dc.identifier.uri | http://hdl.handle.net/11449/113647 | |
dc.identifier.wos | WOS:000335214400015 | |
dc.language.iso | eng | |
dc.publisher | Taylor & Francis Ltd | |
dc.relation.ispartof | Ferroelectrics | |
dc.relation.ispartofjcr | 0.728 | |
dc.relation.ispartofsjr | 0,260 | |
dc.rights.accessRights | Acesso restrito | |
dc.source | Web of Science | |
dc.subject | Piezoelectric | en |
dc.subject | piezoresponse | en |
dc.subject | self-polarization | en |
dc.title | Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films | en |
dc.type | Artigo | |
dcterms.license | http://journalauthors.tandf.co.uk/permissions/reusingOwnWork.asp | |
dcterms.rightsHolder | Taylor & Francis Ltd | |
unesp.author.lattes | 6725982228402054 | |
unesp.campus | Universidade Estadual Paulista (Unesp), Faculdade de Engenharia, Ilha Solteira | pt |
unesp.department | Física e Química - FEIS | pt |