The Variable Sample Size (X)over-bar Chart with Estimated Parameters

dc.contributor.authorCastagliola, Philippe
dc.contributor.authorZhang, Ying
dc.contributor.authorCosta, Antonio [UNESP]
dc.contributor.authorMaravelakis, Petros
dc.contributor.institutionUniv Nantes
dc.contributor.institutionIRCCyN UMR CNRS 6597
dc.contributor.institutionEcole Cent Nantes
dc.contributor.institutionWuhan Univ Technol
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniv Aegean
dc.date.accessioned2014-05-20T15:33:02Z
dc.date.available2014-05-20T15:33:02Z
dc.date.issued2012-11-01
dc.description.abstractThe VSS X chart, dedicated to the detection of small to moderate mean shifts in the process, has been investigated by several researchers under the assumption of known process parameters. In practice, the process parameters are rarely known and are usually estimated from an in-control Phase I data set. In this paper, we evaluate the (run length) performances of the VSS chart when the process parameters are estimated, we compare them in the case where the process parameters are assumed known and we propose specific optimal control chart parameters taking the number of Phase I samples into account.en
dc.description.affiliationUniv Nantes, LUNAM Univ, Nantes, France
dc.description.affiliationIRCCyN UMR CNRS 6597, Nantes, France
dc.description.affiliationEcole Cent Nantes, Nantes, France
dc.description.affiliationWuhan Univ Technol, Sch Logist Engn, Wuhan, Peoples R China
dc.description.affiliationSão Paulo State Univ, Guaratingueta, Brazil
dc.description.affiliationUniv Aegean, Samos, Greece
dc.description.affiliationUnespSão Paulo State Univ, Guaratingueta, Brazil
dc.format.extent687-699
dc.identifierhttp://dx.doi.org/10.1002/qre.1261
dc.identifier.citationQuality and Reliability Engineering International. Hoboken: Wiley-blackwell, v. 28, n. 7, p. 687-699, 2012.
dc.identifier.doi10.1002/qre.1261
dc.identifier.issn0748-8017
dc.identifier.urihttp://hdl.handle.net/11449/41782
dc.identifier.wosWOS:000310486600003
dc.language.isoeng
dc.publisherWiley-Blackwell
dc.relation.ispartofQuality and Reliability Engineering International
dc.relation.ispartofjcr1.604
dc.relation.ispartofsjr0,955
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subject(X)over-bar charten
dc.subjectadaptative charten
dc.subjectestimated parameteren
dc.subjectrun lengthen
dc.titleThe Variable Sample Size (X)over-bar Chart with Estimated Parametersen
dc.typeArtigo
dcterms.licensehttp://olabout.wiley.com/WileyCDA/Section/id-406071.html
dcterms.rightsHolderWiley-blackwell

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