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Enhanced multi-wavelength holographic profilometry by laser mode selection

dc.contributor.authorMuramatsu, Mikiya
dc.contributor.authorBarbosa, Eduardo A.
dc.contributor.authorLima, Eduardo A. [UNESP]
dc.contributor.authorGesualdi, Marcos R.R.
dc.contributor.institutionInstituto de Física
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversity of Vale do Paraiba
dc.date.accessioned2014-05-27T11:22:00Z
dc.date.available2014-05-27T11:22:00Z
dc.date.issued2006-10-19
dc.description.abstractThe application of multi-wavelength holography for surface shape measurement is presented. In our holographic setup a Bi12TiO 20 (BTO) photorefractive crystal was the holographic recording medium and a multimode diode laser emitting in the red region was the light source in a two-wave mixing scheme. The holographic imaging with multimode lasers results in multiple holograms in the BTO. By employing such lasers the resulting holographic image appears covered of interference fringes corresponding to the object relief and the interferogram spatial frequency is proportional to the diode laser free spectral range (FSR). We used a Fabry-Perot étalon at the laser output for laser mode selection. Thus, larger effective values of the laser FSR were achieved, leading to higher-spatial frequency interferograms and therefore to more sensitive and accurate measurements. The quantitative evaluation of the interferograms was performed through the phase stepping technique (PST) and the phase map unwrapping was carried out through the Cellular-Automata method. For a given surface, shape measurements with different interferogram spatial frequencies were performed and compared, concerning measurement noise and visual inspection.en
dc.description.affiliationInstituto de Física, 187, Cidade Universitaria, CEP 05508-900 São Paulo - SP
dc.description.affiliationFaculdade de Tecnologia de São Paulo CEETEPS UNESP, Pça Cel Fernando Prestes, 30, 01124-060, São Paulo - SP
dc.description.affiliationResearch and Development Institute-IPD University of Vale do Paraiba, Sao Jose dos Campos - SP
dc.description.affiliationUnespFaculdade de Tecnologia de São Paulo CEETEPS UNESP, Pça Cel Fernando Prestes, 30, 01124-060, São Paulo - SP
dc.identifierhttp://dx.doi.org/10.1117/12.695337
dc.identifier.citationProceedings of SPIE - The International Society for Optical Engineering, v. 6341.
dc.identifier.doi10.1117/12.695337
dc.identifier.issn0277-786X
dc.identifier.scopus2-s2.0-33749849959
dc.identifier.urihttp://hdl.handle.net/11449/69175
dc.language.isoeng
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineering
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectDiode lasers
dc.subjectHolographic interferometry
dc.subjectPhotorefractive crystals
dc.subjectFree spectral range (FSR)
dc.subjectHolographic images
dc.subjectPhase stepping technique (PST)
dc.subjectHolograms
dc.subjectLaser modes
dc.subjectOptical variables control
dc.subjectSemiconductor lasers
dc.subjectProfilometry
dc.titleEnhanced multi-wavelength holographic profilometry by laser mode selectionen
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://proceedings.spiedigitallibrary.org/ss/TermsOfUse.aspx
dspace.entity.typePublication

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