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Using shifts in the electronic emission curve to evaluate polymer surface degradation

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dc.contributor.authorChinaglia, D. L.
dc.contributor.authorHessel, R.
dc.contributor.authorOliveira, O. N.
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:30:39Z
dc.date.available2014-05-20T15:30:39Z
dc.date.issued2001-01-01
dc.description.abstractThe polymer surface degradation and/or modification evolution of Teflon FEP and Mylar C films caused by a low energy electron beam were analyzed using a new method that consists in measuring the second crossover energy shift in the electronic emission curve. Upon prolonged irradiation, the second crossover energy shifts irreversibly to lower values in Teflon FEP but to higher values in Mylar C, indicating distinct mechanisms of surface degradation for the two polymers. The method represents a relatively inexpensive way to monitor early stages of surface degradation since the secondary electron emission comes from a maximum depth below the geometric surface of 100 mn in insulators. (C) 2001 Elsevier B.V. Ltd. All rights reserved.en
dc.description.affiliationUniv São Paulo, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, Brazil
dc.description.affiliationUniv Estadual Paulista, Dept Fis, IGCE, BR-13500970 Rio Claro, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Dept Fis, IGCE, BR-13500970 Rio Claro, SP, Brazil
dc.format.extent97-101
dc.identifierhttp://dx.doi.org/10.1016/S0141-3910(01)00106-9
dc.identifier.citationPolymer Degradation and Stability. Oxford: Elsevier B.V., v. 74, n. 1, p. 97-101, 2001.
dc.identifier.doi10.1016/S0141-3910(01)00106-9
dc.identifier.issn0141-3910
dc.identifier.lattes8870539749821067
dc.identifier.urihttp://hdl.handle.net/11449/39977
dc.identifier.wosWOS:000171263200010
dc.language.isoeng
dc.publisherElsevier B.V.
dc.relation.ispartofPolymer Degradation and Stability
dc.relation.ispartofjcr3.193
dc.relation.ispartofsjr1,041
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectpolymer degradationpt
dc.subjectelectron beam irradiationpt
dc.subjectsecondary electronspt
dc.titleUsing shifts in the electronic emission curve to evaluate polymer surface degradationen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderElsevier B.V.
dspace.entity.typePublication
unesp.author.lattes8870539749821067
unesp.author.orcid0000-0002-5399-5860[3]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Geociências e Ciências Exatas, Rio Claropt
unesp.departmentFísica - IGCEpt

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Rio Claro - IGCE - Instituto de Geociências e Ciências Exatas