Publicação: Epitaxial stress and texture in thin oxide layers grown on Fe-Al alloys
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The development of internal stress and texture in the oxide scales grown on Fe-15 at.% Al (1 0 0) and (1 1 1) single crystals at 700 °C was determined in situ using synchrotron X-ray diffraction. At this low oxidation temperature oxide scale thickness as revealed by X-ray photoelectron spectroscopy and transmission electron microscopy was situated between 100 and 150 nm after 650 min oxidation. Trigonal α-Fe 2O 3 was found to act as a crystallographic template for the nucleation of isostructural α-Al 2O 3. Strain behavior during oxidation was found to be influenced by the epitaxial relationship between α-Al 2O 3 and α-Fe 2O 3. © 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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Energy-dispersive diffraction, Epitaxy, Internal stress, Oxidation, Texture
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Inglês
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Acta Materialia, v. 60, n. 3, p. 1230-1237, 2012.
