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Dynamical scaling in fractal structures in the aggregation of tetraethoxysilane-derived sonogels

dc.contributor.authorVollet, Dimas R. [UNESP]
dc.contributor.authorDonatti, Dario A. [UNESP]
dc.contributor.authorRuiz, Alberto Ibanez [UNESP]
dc.contributor.authorVicente, Fábio Simões de [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2013-09-30T18:50:55Z
dc.date.accessioned2014-05-20T14:16:39Z
dc.date.available2013-09-30T18:50:55Z
dc.date.available2014-05-20T14:16:39Z
dc.date.issued2010-10-01
dc.description.abstractDynamical scaling properties in fractal structures were investigated from small-angle X-ray scattering (SAXS) data of the kinetics of aggregation in silica-based gelling systems. For lack of a maximum in the SAXS intensity curves, a characteristic correlation distance xi was evaluated by fitting a particle scattering factor model valid for polydisperse coils of linear chains and f-functional branched polycondensates in solution, so the intensity at q = xi-1, I(xi-1, t), was considered to probe dynamical scaling properties. The following properties have been found: (i) the SAXS intensities corresponding to different times t, I(q, t), are given by a time-independent function F(q xi) = I(q, t)xi-D /Q, where the scattering invariant Q has been found to be time-independent; (ii) xi exhibited a power-law behavior with time as xi similar or equal to t alpha, the exponent alpha being close to 1 but diminishing with temperature; (iii) I(xi-1, t) exhibited a time dependence given by I(xi-1, t) similar or equal to t beta, with the exponent beta found to be around 2 but diminishing with temperature, following the same behavior as the exponent alpha. In all cases, beta/alpha was quite close to the fractal dimension D at the end of the studied process. This set of findings is in notable agreement with the dynamical scaling properties.en
dc.description.affiliationUnesp Univ Estadual Paulista, IGCE Dept Fis, BR-13500970 Rio Claro, SP, Brazil
dc.description.affiliationUnespUnesp Univ Estadual Paulista, IGCE Dept Fis, BR-13500970 Rio Claro, SP, Brazil
dc.description.sponsorshipLaboratório Nacional de Luz Síncrotron (LNLS)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.format.extent949-954
dc.identifierhttp://dx.doi.org/10.1107/S0021889810025161
dc.identifier.citationJournal of Applied Crystallography. Malden: Wiley-blackwell, v. 43, p. 949-954, 2010.
dc.identifier.doi10.1107/S0021889810025161
dc.identifier.issn0021-8898
dc.identifier.lattes3538107401166553
dc.identifier.lattes5890636096105376
dc.identifier.urihttp://hdl.handle.net/11449/25008
dc.identifier.wosWOS:000281996600001
dc.language.isoeng
dc.publisherWiley-Blackwell
dc.relation.ispartofJournal of Applied Crystallography
dc.relation.ispartofsjr1,635
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectdynamical scalingen
dc.subjectfractal structuresen
dc.subjectsmall-angle X-ray scatteringen
dc.subjectsilica-based gelsen
dc.titleDynamical scaling in fractal structures in the aggregation of tetraethoxysilane-derived sonogelsen
dc.typeArtigo
dcterms.licensehttp://journals.iucr.org/services/copyrightpolicy.html
dcterms.rightsHolderWiley-blackwell
dspace.entity.typePublication
unesp.author.lattes3538107401166553
unesp.author.lattes5890636096105376
unesp.author.orcid0000-0001-8154-9692[1]
unesp.author.orcid0000-0001-7696-3004[4]
unesp.campusUniversidade Estadual Paulista (UNESP), Instituto de Geociências e Ciências Exatas, Rio Claropt
unesp.departmentFísica - IGCEpt

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