Publicação: What is the Importance of Selecting Features for Non-Technical Losses Identif cation?
dc.contributor.author | Ramos, Caio C. O. | |
dc.contributor.author | Papa, Joao P. [UNESP] | |
dc.contributor.author | Souza, Andre N. [UNESP] | |
dc.contributor.author | Chiachia, Giovani | |
dc.contributor.author | Falcao, Alexandre X. | |
dc.contributor.author | IEEE | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | |
dc.date.accessioned | 2020-12-10T22:02:28Z | |
dc.date.available | 2020-12-10T22:02:28Z | |
dc.date.issued | 2011-01-01 | |
dc.description.abstract | Although non-technical losses automatic identif cation has been massively studied, the problem of selecting the most representative features in order to boost the identif cation accuracy has not attracted much attention in this context. In this paper, we focus on this problem applying a novel feature selection algorithm based on Particle Swarm Optimization and Optimum-Path Forest. The results demonstrated that this method can improve the classif cation accuracy of possible frauds up to 49% in some datasets composed by industrial and commercial prof les. | en |
dc.description.affiliation | Univ Sao Paulo, Dept Elect Engn, Sao Paulo, Brazil | |
dc.description.affiliation | Sao Paulo State Univ, UNESP, Dept Comp, Sao Paulo, Brazil | |
dc.description.affiliation | Sao Paulo State Univ, UNESP, Dept Elect Engn, Sao Paulo, Brazil | |
dc.description.affiliation | Univ Estadual Campinas, Inst Comp, Sao Paulo, Brazil | |
dc.description.affiliationUnesp | Sao Paulo State Univ, UNESP, Dept Comp, Sao Paulo, Brazil | |
dc.description.affiliationUnesp | Sao Paulo State Univ, UNESP, Dept Elect Engn, Sao Paulo, Brazil | |
dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
dc.description.sponsorshipId | FAPESP: 2009/16206-1 | |
dc.format.extent | 1045-1048 | |
dc.identifier.citation | 2011 Ieee International Symposium On Circuits And Systems (iscas). New York: Ieee, p. 1045-1048, 2011. | |
dc.identifier.issn | 0271-4302 | |
dc.identifier.uri | http://hdl.handle.net/11449/197407 | |
dc.identifier.wos | WOS:000297265301069 | |
dc.language.iso | eng | |
dc.publisher | Ieee | |
dc.relation.ispartof | 2011 Ieee International Symposium On Circuits And Systems (iscas) | |
dc.source | Web of Science | |
dc.title | What is the Importance of Selecting Features for Non-Technical Losses Identif cation? | en |
dc.type | Trabalho apresentado em evento | |
dcterms.license | http://www.ieee.org/publications_standards/publications/rights/rights_policies.html | |
dcterms.rightsHolder | Ieee | |
dspace.entity.type | Publication | |
unesp.campus | Universidade Estadual Paulista (UNESP), Faculdade de Ciências, Bauru | pt |
unesp.department | Computação - FC | pt |