Publicação: Raman phonon modes of zinc blende InxGa1-xN alloy epitaxial layers
dc.contributor.author | Tabata, A. | |
dc.contributor.author | Leite, JR | |
dc.contributor.author | Lima, A. P. | |
dc.contributor.author | Silveira, E. | |
dc.contributor.author | Lemos, V | |
dc.contributor.author | Frey, T. | |
dc.contributor.author | As, D. J. | |
dc.contributor.author | Schikora, D. | |
dc.contributor.author | Lischka, K. | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | |
dc.contributor.institution | Univ Gesamthsch Paderborn | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.date.accessioned | 2014-05-20T15:29:45Z | |
dc.date.available | 2014-05-20T15:29:45Z | |
dc.date.issued | 1999-08-23 | |
dc.description.abstract | Transverse-optical (TO) and longitudinal-optical (LO) phonons of zinc blende InxGa1-xN (0 less than or equal to x less than or equal to 0.31) layers are observed through first-order micro-Raman scattering experiments. The samples are grown by molecular-beam epitaxy on GaAs (001) substrates, and x-ray diffraction measurements are performed to determine the epilayer alloy composition. Both the TO and LO phonons exhibit a one-mode-type behavior, and their frequencies display a linear dependence on the composition. The Raman data reported here are used to predict the A(1) (TO) and E-1 (TO) phonon frequencies of the hexagonal InxGa1-xN alloy. (C) 1999 American Institute of Physics. [S0003-6951(99)01234-6]. | en |
dc.description.affiliation | Univ São Paulo, Inst Fis, BR-05315970 São Paulo, Brazil | |
dc.description.affiliation | Univ Estadual Campinas, Inst Fis Gleb Wataghin, BR-13083970 Campinas, SP, Brazil | |
dc.description.affiliation | Univ Gesamthsch Paderborn, FB Phys 6, D-33098 Paderborn, Germany | |
dc.description.affiliation | UNESP, São Paulo, Brazil | |
dc.description.affiliationUnesp | UNESP, São Paulo, Brazil | |
dc.format.extent | 1095-1097 | |
dc.identifier | http://dx.doi.org/10.1063/1.124608 | |
dc.identifier.citation | Applied Physics Letters. Woodbury: Amer Inst Physics, v. 75, n. 8, p. 1095-1097, 1999. | |
dc.identifier.doi | 10.1063/1.124608 | |
dc.identifier.file | WOS000082037500022.pdf | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | http://hdl.handle.net/11449/39252 | |
dc.identifier.wos | WOS:000082037500022 | |
dc.language.iso | eng | |
dc.publisher | American Institute of Physics (AIP) | |
dc.relation.ispartof | Applied Physics Letters | |
dc.relation.ispartofjcr | 3.495 | |
dc.relation.ispartofsjr | 1,382 | |
dc.rights.accessRights | Acesso aberto | |
dc.source | Web of Science | |
dc.title | Raman phonon modes of zinc blende InxGa1-xN alloy epitaxial layers | en |
dc.type | Artigo | |
dcterms.license | http://publishing.aip.org/authors/web-posting-guidelines | |
dcterms.rightsHolder | Amer Inst Physics | |
dspace.entity.type | Publication | |
unesp.author.lattes | 9354064620643611[1] | |
unesp.author.orcid | 0000-0002-9389-0238[1] |
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