Publicação: Effects of annealing on the crystallization and roughness of PLZT thin films
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Elsevier B.V.
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Lead lanthanum zirconate titanate (PLZT) thin films with stoichiometry (9/65/35) were prepared by a dip-coating process using a polymeric organic solution. The solution viscosity was adjusted in the range of 15-56 cP. Silicon (100) substrates were previously cleaned and then immersed in the solution. The withdrawal speed of substrate from the solution was adjusted within a range of 5 to 20 mm/min. The coated substrates were thermally treated in the 450-700 degreesC temperature range. Surface roughness and crystallization of these films are strongly dependent on the annealing conditions. Infrared and X-ray diffraction data for PLZT powders heat-treated at 650 degreesC for 3 h show that the material is free of carbonate phases and crystalline. (C) 2001 Elsevier B.V. B.V. All rights reserved.
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annealing, crystallization, surface roughness, x-ray diffraction
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Inglês
Como citar
Thin Solid Films. Lausanne: Elsevier B.V. Sa, v. 384, n. 1, p. 132-137, 2001.
