Publicação: X-ray photoelectron spectroscopy, x-ray absorption spectroscopy, and x-ray diffraction characterization of CuO-TiO2-CeO2 catalyst system
dc.contributor.author | Francisco, MSP | |
dc.contributor.author | Nascente, PAP | |
dc.contributor.author | Mastelaro, V. R. | |
dc.contributor.author | Florentino, A. O. | |
dc.contributor.institution | Universidade Federal de São Carlos (UFSCar) | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.date.accessioned | 2014-05-20T13:53:17Z | |
dc.date.available | 2014-05-20T13:53:17Z | |
dc.date.issued | 2001-07-01 | |
dc.description.abstract | X-ray photoelectron spectroscopy (XPS), x-ray diffraction (XRD), and x-ray absorption spectroscopy (XAS) techniques have been applied to characterize the surface composition and structure of a series of CuO-TiO2-CeO2 catalysts. For a small loading of cerium, ceria was mainly dispersed on the titania surface and a minor amount of CeO2 crystallite appeared. At higher loading of cerium, the CeO2 phase increased and the atomic Ce/Ti ratio values were smaller than the nominal composition, as a consequence of cerium agglomeration. This result suggests that only a fraction of cerium can be spread on the titania surface. For titanium-based mixed oxide, we observed that cerium is found as Ce3+ uniquely on the surface. The atomic Cu/(Ce+Ti) ratio values showed no influence from cerium concentration on the dispersion of copper, although the copper on the surface was shown to be dependent on the cerium species. For samples with a high amount of cerium, XPS analysis indicated the raise of second titanium species due cerium with spin-orbit components at higher binding energies than those presented by Ti4+ in a tetragonal structure. The structural results obtained by XAS are consistent with those obtained by XRD and XPS. (C) 2001 American Vacuum Society. | en |
dc.description.affiliation | Univ Fed Sao Carlos, Dept Mat Engn, Ctr Caracterizacao & Desenvolvimento Mat, BR-13565905 Sao Carlos, SP, Brazil | |
dc.description.affiliation | Univ São Paulo, Dept Fis & Ciência Mat, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil | |
dc.description.affiliation | Univ Estadual Paulista, Dept Quim, Inst Biociencias, BR-18618000 Botucatu, SP, Brazil | |
dc.description.affiliationUnesp | Univ Estadual Paulista, Dept Quim, Inst Biociencias, BR-18618000 Botucatu, SP, Brazil | |
dc.format.extent | 1150-1157 | |
dc.identifier | http://dx.doi.org/10.1116/1.1345911 | |
dc.identifier.citation | Journal of Vacuum Science & Technology A-vacuum Surfaces and Films. Melville: Amer Inst Physics, v. 19, n. 4, p. 1150-1157, 2001. | |
dc.identifier.doi | 10.1116/1.1345911 | |
dc.identifier.file | WOS000170110900023.pdf | |
dc.identifier.issn | 0734-2101 | |
dc.identifier.uri | http://hdl.handle.net/11449/19004 | |
dc.identifier.wos | WOS:000170110900023 | |
dc.language.iso | eng | |
dc.publisher | American Institute of Physics (AIP) | |
dc.relation.ispartof | Journal of Vacuum Science & Technology A-vacuum Surfaces and Films | |
dc.relation.ispartofjcr | 1.761 | |
dc.relation.ispartofsjr | 0,520 | |
dc.rights.accessRights | Acesso aberto | |
dc.source | Web of Science | |
dc.title | X-ray photoelectron spectroscopy, x-ray absorption spectroscopy, and x-ray diffraction characterization of CuO-TiO2-CeO2 catalyst system | en |
dc.type | Artigo | |
dcterms.license | http://publishing.aip.org/authors/web-posting-guidelines | |
dcterms.rightsHolder | Amer Inst Physics | |
dspace.entity.type | Publication | |
unesp.author.orcid | 0000-0002-6512-2530[3] | |
unesp.author.orcid | 0000-0001-9512-4214[3] | |
unesp.campus | Universidade Estadual Paulista (UNESP), Instituto de Biociências, Botucatu | pt |
unesp.department | Química e Bioquímica - IBB | pt |
Arquivos
Pacote Original
1 - 1 de 1
Carregando...
- Nome:
- WOS000170110900023.pdf
- Tamanho:
- 356.25 KB
- Formato:
- Adobe Portable Document Format
Licença do Pacote
1 - 1 de 1
Carregando...
- Nome:
- license.txt
- Tamanho:
- 1.71 KB
- Formato:
- Item-specific license agreed upon to submission
- Descrição: