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Uniaxially strained silicon influence on Two-stage Operational Transconductance Amplifiers designed with SOI FinFET's

dc.contributor.authorRibeiro, Arllen D. R. [UNESP]
dc.contributor.authorAraujo, Gustavo V.
dc.contributor.authorMartino, Joao A.
dc.contributor.authorAgopian, Paula G. D. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2023-07-29T12:29:12Z
dc.date.available2023-07-29T12:29:12Z
dc.date.issued2022-01-01
dc.description.abstractThis paper analyzes the influence of uniaxially strained silicon on two-stage operational transconductance amplifiers (OTA) designed with SOI FinFETs. The OTA is designed with unstrained and strained SOI FinFETs. The circuit design was performed using experimental FinFETs data through LookUp Table (LUT) and Verilog-A model. Two different strategies were evaluated for designing the OTA: the same current bias (Iss) and the same inversion condition (gm/IDS), In both strained designs, the mobility improvement thanks to mechanical stress is responsible for higher voltage gain and gain-bandwidth product. Between the strained designs, the one that consider the same current bias of the unstrained one presents a lower power consumption due to the lower drain current compared to the same inversion condition. In summary, the OTA performance increase when it is designed with strained FinFET's.en
dc.description.affiliationUNESP Sao Paulo State University
dc.description.affiliationLSI/PSI/USP University of Sao Paulo
dc.description.affiliationUnespUNESP Sao Paulo State University
dc.identifierhttp://dx.doi.org/10.1109/SBMICRO55822.2022.9881005
dc.identifier.citation36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings.
dc.identifier.doi10.1109/SBMICRO55822.2022.9881005
dc.identifier.scopus2-s2.0-85139208971
dc.identifier.urihttp://hdl.handle.net/11449/246006
dc.language.isoeng
dc.relation.ispartof36th Symposium on Microelectronics Technology, SBMICRO 2022 - Proceedings
dc.sourceScopus
dc.subjectFinFET
dc.subjectMechanical Strain
dc.subjectOperational Transconductance Amplifiers
dc.titleUniaxially strained silicon influence on Two-stage Operational Transconductance Amplifiers designed with SOI FinFET'sen
dc.typeTrabalho apresentado em evento
dspace.entity.typePublication

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