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Publicação:
Mylar Secondary Emission-energy Distribution and Yields

dc.contributor.authorFonzar Pintao, Carlos Alberto
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-12-03T13:11:46Z
dc.date.available2014-12-03T13:11:46Z
dc.date.issued2014-02-01
dc.description.abstractWe have characterized Mylar by determining the emission yield and energy spectrum of emitted secondary electrons. In this study we used a conventional electron accelerator apparatus to which we have made some important adjustments, especially to determine the normalized energy distribution. These adjustments allowed us to obtain the data necessary to calculate reduced yield curves, (delta/delta(M) vs. E/E-M) in which the secondary emission yields and the Energy of the fixed energy beam were both divided by their maximum values. Results for the total emission yield (sigma), backscattered electrons (eta) and true secondary emission electrons (delta) were obtained as a function of the energy of the incident electron beam (E). The results from an experiment where the incident beam was vertically striking a Mylar sample (thickness 36 mu m) are presented. The location of the first and second crossover points, where delta=1, as well as the energy spectrum of secondary electron emission using a planar symmetry arrangement for energies of 1.2 and 1.4 keV were obtained and presented.en
dc.description.affiliationUniv Estadual Paulista, Dept Fis, Fac Ciencias, BR-17013360 Bauru, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Dept Fis, Fac Ciencias, BR-17013360 Bauru, SP, Brazil
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.format.extent311-316
dc.identifierhttp://dx.doi.org/10.1109/TDEI.2013.004062
dc.identifier.citationIeee Transactions On Dielectrics And Electrical Insulation. Piscataway: Ieee-inst Electrical Electronics Engineers Inc, v. 21, n. 1, p. 311-316, 2014.
dc.identifier.doi10.1109/TDEI.2013.004062
dc.identifier.issn1070-9878
dc.identifier.urihttp://hdl.handle.net/11449/113518
dc.identifier.wosWOS:000332038700036
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofIEEE Transactions on Dielectrics and Electrical Insulation
dc.relation.ispartofjcr1.774
dc.relation.ispartofsjr0,468
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectSecondary electron emissionen
dc.subjectemission yieldsen
dc.subjectelectron beamen
dc.subjectsecondary energy spectrumen
dc.subjectmylaren
dc.subjectreduced yield curvesen
dc.subjectdielectricsen
dc.subjectcrossover pointsen
dc.subjectelectron acceleratoren
dc.subjectpolymersen
dc.titleMylar Secondary Emission-energy Distribution and Yieldsen
dc.typeArtigo
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIeee-inst Electrical Electronics Engineers Inc
dspace.entity.typePublication
unesp.author.lattes7734568419544588[1]
unesp.author.orcid0000-0002-8900-9946[1]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Ciências, Baurupt
unesp.departmentFísica - FCpt

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