NON-DESTRUCTIVE MODEL TO PREDICT Commelina diffusa LEAF AREA
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Univ Federal Vicosa
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Acesso aberto
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Resumo
Leaf length (L), leaf width (W), and leaf area (LA) were measured from 100 leaves aiming to determine a simple linear equation (Y=a*X) to predict the leaf area of Commelina diffusa, an important weed infesting annual and perennial crops in Brazil and worldwide. Results indicate the equation LA=0.7*LW reliably estimates the leaf area of C. diffusa, after correlating LA with LW, and then validating that equation by analyzing four new 25-leaf samples.
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plant growth, biometry, non-destructive method, mathematical model, climbing dayflower
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Inglês
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Planta Daninha. Vicosa: Univ Federal Vicosa, v. 35, 5 p., 2017.
