Study of the influence of the rare earth elements (Ce3+ and Ce4+) concentration on the siloxanes coating applied on the copper surface
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This work studied the influence of the rare earth (Ce3+ and Ce4+) elements concentration in polysiloxane flints deposited on copper by dip-coating process, and evaluated their resistance in a 3.5 wt.% NaCl medium. Classical electrochemistry techniques were used as open circuit potential, polarization curves and electrochemical impedance spectroscopy. The results revealed that by adding low concentration of Ce4+ ions, the coating prevents the electrolyte uptake any longer retarding the substrate degradation consequently. ©The Electrochemical Society.
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Copper surface, Dip-coating process, Low concentrations, Open circuit potential, Polarization curves, Substrate degradation, Copper, Degradation, Electrochemical impedance spectroscopy, Electrochemistry, Silicon compounds, Silicones, Coatings
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Inglês
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ECS Transactions, v. 43, n. 1, p. 3-7, 2012.
