Publicação: Electric measurements with constant current: A practical method for characterizing dielectric films
dc.contributor.author | Giacometti, J. A. | |
dc.contributor.author | Wisniewski, C. | |
dc.contributor.author | Ribeiro, P. A. | |
dc.contributor.author | Moura, W. A. | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.contributor.institution | Universidade de São Paulo (USP) | |
dc.contributor.institution | Univ Nova Lisboa | |
dc.date.accessioned | 2014-05-20T15:21:25Z | |
dc.date.available | 2014-05-20T15:21:25Z | |
dc.date.issued | 2001-11-01 | |
dc.description.abstract | This article assesses the use of the constant current (CC) method for characterizing dielectric films. The method is based on charging the sample with a constant current (current stress) and measuring the corresponding voltage rise under the closed circuit condition. Our article shows that the CC method is an alternative to the constant voltage stressing method to study the electric properties of nonpolar, ferroelectric, and polar polymers. The method was tested by determining the dielectric constant of polytetrafluoroethylene, and investigating the electric conduction in poly(ethylene terephthalate). For the ferroelectric polymer poly(vinylidene fluoride), it is shown that hysteresis loops and the dependence of the ferroelectric polarization on the electric field can be obtained. (C) 2001 American Institute of Physics. | en |
dc.description.affiliation | Univ Estadual Paulista, Fac Ciências & Tecnol, BR-10060900 Presidente Prudente, SP, Brazil | |
dc.description.affiliation | Univ São Paulo, Inst Fis Sao Carlos, BR-13566970 Sao Carlos, SP, Brazil | |
dc.description.affiliation | Univ Nova Lisboa, Fac Ciências & Tecnol, Dept Fis, CeFITec, P-2825114 Caparica, Portugal | |
dc.description.affiliationUnesp | Univ Estadual Paulista, Fac Ciências & Tecnol, BR-10060900 Presidente Prudente, SP, Brazil | |
dc.format.extent | 4223-4227 | |
dc.identifier | http://dx.doi.org/10.1063/1.1409564 | |
dc.identifier.citation | Review of Scientific Instruments. Melville: Amer Inst Physics, v. 72, n. 11, p. 4223-4227, 2001. | |
dc.identifier.doi | 10.1063/1.1409564 | |
dc.identifier.file | WOS000171797000028.pdf | |
dc.identifier.issn | 0034-6748 | |
dc.identifier.uri | http://hdl.handle.net/11449/32563 | |
dc.identifier.wos | WOS:000171797000028 | |
dc.language.iso | eng | |
dc.publisher | American Institute of Physics (AIP) | |
dc.relation.ispartof | Review of Scientific Instruments | |
dc.relation.ispartofjcr | 1.428 | |
dc.relation.ispartofsjr | 0,585 | |
dc.rights.accessRights | Acesso aberto | pt |
dc.source | Web of Science | |
dc.title | Electric measurements with constant current: A practical method for characterizing dielectric films | en |
dc.type | Artigo | pt |
dcterms.license | http://publishing.aip.org/authors/web-posting-guidelines | |
dcterms.rightsHolder | Amer Inst Physics | |
dspace.entity.type | Publication | |
unesp.campus | Universidade Estadual Paulista (UNESP), Faculdade de Ciências e Tecnologia, Presidente Prudente | pt |
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