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X-Ray Diffraction and Scattering by Nanomaterials

dc.contributor.authorLamas, Diego G.
dc.contributor.authorde Oliveira Neto, Mario
dc.contributor.authorKellermann, Guinther
dc.contributor.authorCraievich, Aldo F.
dc.contributor.institutionNational University of San Martín
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionFederal University of Paraná
dc.date.accessioned2022-04-28T19:07:15Z
dc.date.available2022-04-28T19:07:15Z
dc.date.issued2017-03-23
dc.description.abstractThis chapter contains basic concepts and applications of wide-angle X-ray diffraction (XRD) and small-angle X-ray scattering (SAXS) to studies of nanostructured materials. The first part includes an introduction to the technique of X-ray powder diffraction (XPD), which is commonly applied to phase identification of powdered materials, characterization of unit cells, determinations of lattice parameters and, in some cases, also coordinates of atoms inside the unit cells. The main aspect described here is the analysis of the shape of X-ray diffraction peak profiles, which allows one to determine additional and also valuable structural information of nanomaterials, such as average crystallite sizes and crystallite microstrains. Detailed deductions of the equations used for different applications of X-ray diffraction and basic concepts of crystallography (such as those related to symmetries, Bravais and reciprocal lattices, etc.) are not described. The second part presents the basic equations related to the SAXS method and their applications to several biological systems (proteins in solution). Classical SAXS is an experimental procedure that is employed in transmission mode and is also applied to the study of many nanostructured inorganic materials. The third part includes two variants of the classical SAXS procedure, namely grazing incidence small-angle X-ray scattering (GISAXS) and anomalous small-angle X-ray scattering (ASAXS). The basic concepts of the GISAXS method and several applications to studies of nanostructured materials deposited on flat substrates and buried nanostructures are presented. The basic concepts of the ASAXS method are described, together with its applications to complex materials that cannot be properly studied using the classical SAXS technique, such as, for example, materials modeled by three phases with different electron densities. Most of the experiments described in this chapter were performed by the authors using X-ray beam lines of the National Synchrotron Light Laboratory (LNLS), Campinas, Brazil.en
dc.description.affiliationCONICET/School of Science and Technology National University of San Martín
dc.description.affiliationInstitute of Biosciences University of São Paulo State
dc.description.affiliationDepartment of Physics Federal University of Paraná
dc.description.affiliationInstitute of Physics University of São Paulo
dc.format.extent111-182
dc.identifierhttp://dx.doi.org/10.1016/B978-0-323-49778-7.00005-9
dc.identifier.citationNanocharacterization Techniques, p. 111-182.
dc.identifier.doi10.1016/B978-0-323-49778-7.00005-9
dc.identifier.scopus2-s2.0-85040629809
dc.identifier.urihttp://hdl.handle.net/11449/220998
dc.language.isoeng
dc.relation.ispartofNanocharacterization Techniques
dc.sourceScopus
dc.subjectKinematic theory
dc.subjectMicrostrains
dc.subjectMiller indices
dc.subjectNanomaterial
dc.subjectX-ray diffraction
dc.subjectX-ray scattering
dc.titleX-Ray Diffraction and Scattering by Nanomaterialsen
dc.typeCapítulo de livro
dspace.entity.typePublication

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