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Charge transport and dielectric characteristics of Sm x Bi1−x FeO3 thin films from the perspective of grain and grain boundary properties

dc.contributor.authorMinussi, F. B. [UNESP]
dc.contributor.authorBorges, F. V.A.
dc.contributor.authorAraújo, E. B. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.contributor.institutionUniversity of Rio Verde (UniRV)
dc.date.accessioned2023-07-29T13:18:45Z
dc.date.available2023-07-29T13:18:45Z
dc.date.issued2023-08-31
dc.description.abstractSamarium-substituted bismuth ferrite (Sm x Bi1−x FeO3) compositions comprise a system of important materials due to their combination of multiferroic properties. Several dielectric and charge transport reports in literature can be found in this system. However, as a typical polycrystalline electroceramic, their grains and grain boundaries (GBs) are expected to possess very different properties. To this date, these distinctions have not been determined for this system. In this work, through measurements via impedance spectroscopy on Sm x Bi1−x FeO3 thin films, we show that using a brick layer model allows the separation of the electrical properties of grains and GBs. Results indicate that grains have dielectric permittivity and electrical conductivity much higher than GBs. Their properties mostly control the characteristics observed in the studied thin films. The introduction of samarium reduces the electrical conductivity and increases the activation energies for charge transport in grains and GBs. In turn, dielectric permittivity is reduced in grains and subtly increased in GBs.en
dc.description.affiliationDepartment of Physics and Chemistry São Paulo State University, SP
dc.description.affiliationUniversity of Rio Verde (UniRV)
dc.description.affiliationUnespDepartment of Physics and Chemistry São Paulo State University, SP
dc.identifierhttp://dx.doi.org/10.1088/1361-6463/acd791
dc.identifier.citationJournal of Physics D: Applied Physics, v. 56, n. 35, 2023.
dc.identifier.doi10.1088/1361-6463/acd791
dc.identifier.issn1361-6463
dc.identifier.issn0022-3727
dc.identifier.scopus2-s2.0-85161295230
dc.identifier.urihttp://hdl.handle.net/11449/247538
dc.language.isoeng
dc.relation.ispartofJournal of Physics D: Applied Physics
dc.sourceScopus
dc.subjectbismuth ferrite
dc.subjectbrick layer model
dc.subjectelectrical properties
dc.subjectferroelectric
dc.subjectgrains and grain boundaries
dc.subjectsamarium
dc.subjectthin films
dc.titleCharge transport and dielectric characteristics of Sm x Bi1−x FeO3 thin films from the perspective of grain and grain boundary propertiesen
dc.typeArtigo
dspace.entity.typePublication
unesp.author.orcid0000-0002-1440-7763[1]

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