Logotipo do repositório
 

Publicação:
Ambipolar transport in tin dioxide thin film transistors promoted by PCBM fullerene

dc.contributor.authorBoratto, Miguel H. [UNESP]
dc.contributor.authorScalvi, Luis V. A. [UNESP]
dc.contributor.authorGoncharova, Lyudmila V.
dc.contributor.authorFanchini, Giovanni
dc.contributor.institutionUniversidade Federal de Santa Catarina (UFSC)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversity of Western Ontario
dc.date.accessioned2019-10-06T15:20:53Z
dc.date.available2019-10-06T15:20:53Z
dc.date.issued2018-12-01
dc.description.abstractIn this article, the effect of phenyl-C61-butyric acid methyl ester (PCBM) layer on the electrical performance of field-effect transistors (FETs) based on antimony-doped tin dioxide (Sb:SnO2) is reported. PCBM is a soluble variety of fullerene, n-type organic semiconductor, known to promote the p-type doping of semiconducting materials such as diamond and graphene, via charge transfer. Sb:SnO2 is an emerging low-cost transparent oxide semiconductor material that exhibits strong unipolar behavior (n-type). Ambipolar character in tin dioxide normally is not observed, however in this study we find that the deposition of PCBM on top of Sb:SnO2 promotes ambipolar behavior in Sb:SnO2 FETs. At negative gate bias (VG < 0) PCBM traps free electrons from the conduction band of SnO2 and from Sb donors, thus downshifting the Sb:SnO2 Fermi level (EF), leading to a strong injection of holes in the valence band of Sb:SnO2. The p-type carrier concentration increases up to 8.6 × 1011 cm−2. Our results suggest that PCBM deposition decreases the current in the accumulation mode of electrons due to electron mobility decrease at VG > 0, and enhances the current in inversion mode. Besides, PCBM deposition also results in an increase of hole mobility at VG < 0.en
dc.description.affiliationDepartment of Physics Post-Graduate Program in Physics Federal University of Santa Catarina (UFSC)
dc.description.affiliationDepartment of Physics School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology São Paulo State University (UNESP)
dc.description.affiliationDepartment of Physics and Astronomy University of Western Ontario
dc.description.affiliationCentre of Advanced Materials and Biomaterials Research (CAMBR) University of Western Ontario
dc.description.affiliationDepartment of Chemistry University of Western Ontario
dc.description.affiliationUnespDepartment of Physics School of Sciences POSMAT - Post-Graduate Program in Materials Science and Technology São Paulo State University (UNESP)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipCanadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada
dc.description.sponsorshipIdCNPq: 471359/2013-0
dc.description.sponsorshipIdCanadian Network for Research and Innovation in Machining Technology, Natural Sciences and Engineering Research Council of Canada: RGPIN-2015-06004
dc.format.extent20010-20016
dc.identifierhttp://dx.doi.org/10.1007/s10854-018-0131-9
dc.identifier.citationJournal of Materials Science: Materials in Electronics, v. 29, n. 23, p. 20010-20016, 2018.
dc.identifier.doi10.1007/s10854-018-0131-9
dc.identifier.issn1573-482X
dc.identifier.issn0957-4522
dc.identifier.scopus2-s2.0-85054807144
dc.identifier.urihttp://hdl.handle.net/11449/186952
dc.language.isoeng
dc.relation.ispartofJournal of Materials Science: Materials in Electronics
dc.rights.accessRightsAcesso abertopt
dc.sourceScopus
dc.titleAmbipolar transport in tin dioxide thin film transistors promoted by PCBM fullereneen
dc.typeArtigopt
dspace.entity.typePublication
unesp.author.orcid0000-0001-7055-0751[1]
unesp.campusUniversidade Estadual Paulista (UNESP), Faculdade de Ciências, Baurupt

Arquivos